Any two of several reflection or transmission x-ray topographs taken simultaneously with polychromatic synchrotron radiation form a stereo pair. Multistereoscopic transmission and reflection patterns of topographs taken from a silicon and iron-silicon crystal are presented. The directions and depths of defects are calculated from the measurements on the images in two symmetric topographs.
|Pages (from-to)||607 - 610|
|Number of pages||4|
|Journal||Zeitschrift für Naturforschung Section A: Journal of Physical Sciences|
|Publication status||Published - 1982|
|MoE publication type||A1 Journal article-refereed|