Abstract
Any two of several reflection or transmission x-ray topographs taken simultaneously with polychromatic synchrotron radiation form a stereo pair. Multistereoscopic transmission and reflection patterns of topographs taken from a silicon and iron-silicon crystal are presented. The directions and depths of defects are calculated from the measurements on the images in two symmetric topographs.
| Original language | English |
|---|---|
| Pages (from-to) | 607-610 |
| Journal | Zeitschrift für Naturforschung Section A: Journal of Physical Sciences |
| Volume | 37 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 1982 |
| MoE publication type | A1 Journal article-refereed |