Multistereo synchrotron X-ray topography

T. Tuomi; Väinö Kelhä; K. Naukkarinen; M. Blomberg

doi:10.1515/zna-1982-0615

Multistereo synchrotron X-ray topography

T. Tuomi^*
, Väinö Kelhä
, K. Naukkarinen
, M. Blomberg

^*Corresponding author for this work

VTT Technical Research Centre of Finland

Helsinki University of Technology

Research output: Contribution to journal › Article › Scientific › peer-review

4 Citations (Scopus)

Abstract

Any two of several reflection or transmission x-ray topographs taken simultaneously with polychromatic synchrotron radiation form a stereo pair. Multistereoscopic transmission and reflection patterns of topographs taken from a silicon and iron-silicon crystal are presented. The directions and depths of defects are calculated from the measurements on the images in two symmetric topographs.

Original language	English
Pages (from-to)	607-610
Journal	Zeitschrift fur Naturforschung - Section A Journal of Physical Sciences
Volume	37
Issue number	6
DOIs	https://doi.org/10.1515/zna-1982-0615
Publication status	Published - 1982
MoE publication type	A1 Journal article-refereed

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10.1515/zna-1982-0615Licence: CC BY-NC-ND

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@article{47c7dbd2f83a4e09abb9883577b8bce0,

title = "Multistereo synchrotron X-ray topography",

abstract = "Any two of several reflection or transmission x-ray topographs taken simultaneously with polychromatic synchrotron radiation form a stereo pair. Multistereoscopic transmission and reflection patterns of topographs taken from a silicon and iron-silicon crystal are presented. The directions and depths of defects are calculated from the measurements on the images in two symmetric topographs.",

author = "T. Tuomi and V{\"a}in{\"o} Kelh{\"a} and K. Naukkarinen and M. Blomberg",

year = "1982",

doi = "10.1515/zna-1982-0615",

language = "English",

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TY - JOUR

T1 - Multistereo synchrotron X-ray topography

AU - Tuomi, T.

AU - Kelhä, Väinö

AU - Naukkarinen, K.

AU - Blomberg, M.

PY - 1982

Y1 - 1982

N2 - Any two of several reflection or transmission x-ray topographs taken simultaneously with polychromatic synchrotron radiation form a stereo pair. Multistereoscopic transmission and reflection patterns of topographs taken from a silicon and iron-silicon crystal are presented. The directions and depths of defects are calculated from the measurements on the images in two symmetric topographs.

AB - Any two of several reflection or transmission x-ray topographs taken simultaneously with polychromatic synchrotron radiation form a stereo pair. Multistereoscopic transmission and reflection patterns of topographs taken from a silicon and iron-silicon crystal are presented. The directions and depths of defects are calculated from the measurements on the images in two symmetric topographs.

U2 - 10.1515/zna-1982-0615

DO - 10.1515/zna-1982-0615

M3 - Article

SN - 0932-0784

VL - 37

SP - 607

EP - 610

JO - Zeitschrift fur Naturforschung - Section A Journal of Physical Sciences

JF - Zeitschrift fur Naturforschung - Section A Journal of Physical Sciences

IS - 6

ER -

Multistereo synchrotron X-ray topography

Abstract

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