Near-field measurements of submillimeter-wave reflectarrays

Aleksi Tamminen, Juha Ala-Laurinaho, Sampo Mäkelä, David Gomes Martins, Janne Häkli, Päivi Koivisto, Pekka Rantakari, Jussi Säily, Reijo Tuovinen, Arttu Luukanen, Markku Sipilä, Antti V. Räisänen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

6 Citations (Scopus)

Abstract

We present results of experimental characterization of static 650-GHz reflectarrays. The reflectarrays are based on 123-µm circular microstrip patch antennas with tuning stubs as phase shifters. The static reflectarrays are considered as predecessors for active reflectarrays, and therefore the reflectarray elements have two discrete phase-shift values: 0° and -180°. The reflectarrays have 95000 elements, and they have separation of 400 µm. The reflectarrays are fabricated on 150-mm silicon wafers with a ground plane and a 20-µm polyimide substrate atop. The fabricated static reflectarrays are characterized in a near-field measurement range and their beam patterns at the focusing distance of 20 m are calculated with plane-to-plane transform. At this high frequency, fabrication tolerances are difficult to meet and, e.g., over-etching of the antenna and phase-shifting structure may offset the resonance frequency of the reflectarray element by more than its bandwidth.
Original languageEnglish
Title of host publicationPassive and Active Millimeter-Wave Imaging XVI
EditorsDavid A. Wikner, Arttu R. Luukanen
Place of PublicationBellingham
PublisherInternational Society for Optics and Photonics SPIE
ISBN (Print)978-0-8194-9506-8
DOIs
Publication statusPublished - 2013
MoE publication typeA4 Article in a conference publication
EventSPIE Defense, Security, and Sensing 2013 - Baltimore, United States
Duration: 29 Apr 20133 May 2013

Publication series

SeriesProceedings of SPIE
Volume8715
ISSN0277-786X

Conference

ConferenceSPIE Defense, Security, and Sensing 2013
CountryUnited States
CityBaltimore
Period29/04/133/05/13

Keywords

  • imaging radar
  • near-field measurements
  • reflectarray
  • submillimeter-wave

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  • Cite this

    Tamminen, A., Ala-Laurinaho, J., Mäkelä, S., Gomes Martins, D., Häkli, J., Koivisto, P., Rantakari, P., Säily, J., Tuovinen, R., Luukanen, A., Sipilä, M., & Räisänen, A. V. (2013). Near-field measurements of submillimeter-wave reflectarrays. In D. A. Wikner, & A. R. Luukanen (Eds.), Passive and Active Millimeter-Wave Imaging XVI [871506] International Society for Optics and Photonics SPIE. Proceedings of SPIE, Vol.. 8715 https://doi.org/10.1117/12.2018606