New evaluation of T - T2000 from 0.02 K to 1 K by independent thermodynamics methods

Jost Engert (Corresponding Author), Alexander Kirste, Aya Shibahara, Andrew Casey, Lev Levitin, John Saunders, Ossi Hahtela, Antti Kemppinen, Emma Mykkänen, Mika Prunnila, David Gunnarsson, Leif Roschier, Matthias Meschke, Jukka Pekola

    Research output: Contribution to journalArticleScientificpeer-review

    8 Citations (Scopus)

    Abstract

    This paper reports on the results achieved within the European Metrology Research Programme project "Implementing the new kelvin-InK" in the low-temperature range below 1 K. One of the main objectives of the InK project was the determination of new thermodynamic temperature data for comparison with the Provisional Low Temperature Scale 2000 (PLTS-2000), to provide reliable T-T2000T-T2000 values. To this end, we have investigated three different types of primary thermometers: the current sensing noise thermometer, the primary magnetic field fluctuation thermometer and the Coulomb blockade thermometer. Based on a thorough investigation of the thermometers, detailed uncertainty budgets were established for the measurement of thermodynamic temperatures. Direct comparison measurements between all thermometers demonstrate the agreement of temperature measurements within less than 1 %. Our new T-T2000T-T2000 data confirm the correctness of the PLTS-2000 in the temperature range from 20 mK up to about 700 mK with relative combined standard uncertainties better than 0.62 %.
    Original languageEnglish
    JournalInternational Journal of Thermophysics
    Volume37
    Issue number125
    DOIs
    Publication statusPublished - 2016
    MoE publication typeA1 Journal article-refereed

    Keywords

    • mise en pratique of the kelvin
    • MeP-K
    • PLTS-2000
    • primary thermometry
    • temperature scale

    Fingerprint

    Dive into the research topics of 'New evaluation of T - T2000 from 0.02 K to 1 K by independent thermodynamics methods'. Together they form a unique fingerprint.

    Cite this