New methods for the assessment of ESD threats to electronic components

Jaakko Paasi, Jeremy Smallwood, Hannu Salmela

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    5 Citations (Scopus)

    Abstract

    We propose new methods for the assessment of real ESD threats to electronic components in modern electronics manufacturing environment. The methods are the use of current threshold for damage for ESD from a source into a device, energy threshold for damage for very short ESD pulses to a device, and charge threshold for CDM type of ESD. We suggest how guideline limits for ESD damage thresholds may be derived. The concept of the current threshold has been tested by experiments.
    Original languageEnglish
    Title of host publication2003 EOS/ESD Symposium Proceedings
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages151-160
    ISBN (Electronic)978-1-5853-7057-3
    ISBN (Print)1-58537-057-6
    Publication statusPublished - 2003
    MoE publication typeA4 Article in a conference publication
    Event25th Electrical Overstress/Electrostatic Discharge Symposium, EOS-25 - Las Vegas, United States
    Duration: 21 Sep 200325 Sep 2003

    Conference

    Conference25th Electrical Overstress/Electrostatic Discharge Symposium, EOS-25
    CountryUnited States
    CityLas Vegas
    Period21/09/0325/09/03

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