New techniques for radiometric testing of infrared light emitting diodes

Jouko Malinen, Hannu Lindström, Jarmo Lehtomaa

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

Infrared light emitting diodes (LEDs) may be used as radiation sources for optical sensors and instruments. Radiometric characteristics of LEDs, either as unpackaged chips or packaged components, will depend very much on device technology and construction. Exact radiometric information is very useful for modelling and optimising sensor performance. This paper reports some interesting techniques, which have been recently tested by VTT Electronics and Spectral Imaging Ltd for estimation of radiometric properties of infrared light emitting diodes.
Original languageEnglish
Title of host publication7th International Conference on Mid-Infrared Optoelectronic Materials and Devices, MIOMD-VII
Subtitle of host publicationLancaster, UK, 12-14 September 2005
Pages65-66
Publication statusPublished - 2005
MoE publication typeNot Eligible

Fingerprint Dive into the research topics of 'New techniques for radiometric testing of infrared light emitting diodes'. Together they form a unique fingerprint.

  • Cite this

    Malinen, J., Lindström, H., & Lehtomaa, J. (2005). New techniques for radiometric testing of infrared light emitting diodes. In 7th International Conference on Mid-Infrared Optoelectronic Materials and Devices, MIOMD-VII: Lancaster, UK, 12-14 September 2005 (pp. 65-66)