New techniques for radiometric testing of infrared light emitting diodes

Jouko Malinen; Hannu Lindström; Jarmo Lehtomaa

New techniques for radiometric testing of infrared light emitting diodes

Jouko Malinen, Hannu Lindström, Jarmo Lehtomaa

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Abstract

Infrared light emitting diodes (LEDs) may be used as radiation sources for optical sensors and instruments. Radiometric characteristics of LEDs, either as unpackaged chips or packaged components, will depend very much on device technology and construction. Exact radiometric information is very useful for modelling and optimising sensor performance. This paper reports some interesting techniques, which have been recently tested by VTT Electronics and Spectral Imaging Ltd for estimation of radiometric properties of infrared light emitting diodes.

Original language	English
Title of host publication	7th International Conference on Mid-Infrared Optoelectronic Materials and Devices, MIOMD-VII
Subtitle of host publication	Lancaster, UK, 12-14 September 2005
Pages	65-66
Publication status	Published - 2005
MoE publication type	Not Eligible

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title = "New techniques for radiometric testing of infrared light emitting diodes",

abstract = "Infrared light emitting diodes (LEDs) may be used as radiation sources for optical sensors and instruments. Radiometric characteristics of LEDs, either as unpackaged chips or packaged components, will depend very much on device technology and construction. Exact radiometric information is very useful for modelling and optimising sensor performance. This paper reports some interesting techniques, which have been recently tested by VTT Electronics and Spectral Imaging Ltd for estimation of radiometric properties of infrared light emitting diodes.",

author = "Jouko Malinen and Hannu Lindstr{\"o}m and Jarmo Lehtomaa",

note = "No ISBN/ISSN found for the proceedings",

year = "2005",

language = "English",

pages = "65--66",

booktitle = "7th International Conference on Mid-Infrared Optoelectronic Materials and Devices, MIOMD-VII",

}

New techniques for radiometric testing of infrared light emitting diodes. / Malinen, Jouko; Lindström, Hannu; Lehtomaa, Jarmo.

7th International Conference on Mid-Infrared Optoelectronic Materials and Devices, MIOMD-VII: Lancaster, UK, 12-14 September 2005. 2005. p. 65-66.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - New techniques for radiometric testing of infrared light emitting diodes

AU - Malinen, Jouko

AU - Lindström, Hannu

AU - Lehtomaa, Jarmo

N1 - No ISBN/ISSN found for the proceedings

PY - 2005

Y1 - 2005

N2 - Infrared light emitting diodes (LEDs) may be used as radiation sources for optical sensors and instruments. Radiometric characteristics of LEDs, either as unpackaged chips or packaged components, will depend very much on device technology and construction. Exact radiometric information is very useful for modelling and optimising sensor performance. This paper reports some interesting techniques, which have been recently tested by VTT Electronics and Spectral Imaging Ltd for estimation of radiometric properties of infrared light emitting diodes.

AB - Infrared light emitting diodes (LEDs) may be used as radiation sources for optical sensors and instruments. Radiometric characteristics of LEDs, either as unpackaged chips or packaged components, will depend very much on device technology and construction. Exact radiometric information is very useful for modelling and optimising sensor performance. This paper reports some interesting techniques, which have been recently tested by VTT Electronics and Spectral Imaging Ltd for estimation of radiometric properties of infrared light emitting diodes.

M3 - Conference article in proceedings

SP - 65

EP - 66

BT - 7th International Conference on Mid-Infrared Optoelectronic Materials and Devices, MIOMD-VII

ER -