Infrared light emitting diodes (LEDs) may be used as radiation sources for optical sensors and instruments. Radiometric characteristics of LEDs, either as unpackaged chips or packaged components, will depend very much on device technology and construction. Exact radiometric information is very useful for modelling and optimising sensor performance. This paper reports some interesting techniques, which have been recently tested by VTT Electronics and Spectral Imaging Ltd for estimation of radiometric properties of infrared light emitting diodes.
|Title of host publication||7th International Conference on Mid-Infrared Optoelectronic Materials and Devices, MIOMD-VII|
|Subtitle of host publication||Lancaster, UK, 12-14 September 2005|
|Publication status||Published - 2005|
|MoE publication type||Not Eligible|
Malinen, J., Lindström, H., & Lehtomaa, J. (2005). New techniques for radiometric testing of infrared light emitting diodes. In 7th International Conference on Mid-Infrared Optoelectronic Materials and Devices, MIOMD-VII: Lancaster, UK, 12-14 September 2005 (pp. 65-66)