New verification routine for pulsed I-V and transient current measurement setup applied to a THz Schottky diode

S Khanal, Tero Kiuru, J Mallat, A V Räisänen, T Närhi

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

3 Citations (Scopus)

Abstract

In this paper, a verification routine is developed for validating extremely fast pulsed I-V and transient current measurement setups. The measurements performed for the routine include pulsed I-V measurement with different pulse widths (using several voltage and current levels) as well as transient current measurement using different heating and measurement current levels. All the measurements are carried out for several discrete resistors attached on on-wafer test carriers. To demonstrate the usability of the setup, pulsed I-V and transient current measurement results of a THz Schottky diode are presented after the verification routine
Original languageEnglish
Title of host publicationProceedings of the
Subtitle of host publication43rd European Microwave Conference, EuMC 2013
PublisherInstitute of Electrical and Electronic Engineers IEEE
Pages1279 - 1282
ISBN (Print)978-2-87487-031-6
DOIs
Publication statusPublished - 2013
MoE publication typeNot Eligible
Event43rd European Microwave Conference, EuMC 2013: Held as Part of the 16th European Microwave Week - Nuremberg, Germany
Duration: 7 Oct 201310 Oct 2013
Conference number: 43

Conference

Conference43rd European Microwave Conference, EuMC 2013
Abbreviated titleEuMC 2013
CountryGermany
CityNuremberg
Period7/10/1310/10/13

Fingerprint

Schottky diodes
resistors
pulse duration
wafers
heating
electric potential

Keywords

  • Pulsed I-V
  • schottky diode
  • thermal impedance
  • transient current measurement

Cite this

Khanal, S., Kiuru, T., Mallat, J., Räisänen, A. V., & Närhi, T. (2013). New verification routine for pulsed I-V and transient current measurement setup applied to a THz Schottky diode. In Proceedings of the: 43rd European Microwave Conference, EuMC 2013 (pp. 1279 - 1282). Institute of Electrical and Electronic Engineers IEEE. https://doi.org/10.23919/EuMC.2013.6686898
Khanal, S ; Kiuru, Tero ; Mallat, J ; Räisänen, A V ; Närhi, T. / New verification routine for pulsed I-V and transient current measurement setup applied to a THz Schottky diode. Proceedings of the: 43rd European Microwave Conference, EuMC 2013. Institute of Electrical and Electronic Engineers IEEE, 2013. pp. 1279 - 1282
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abstract = "In this paper, a verification routine is developed for validating extremely fast pulsed I-V and transient current measurement setups. The measurements performed for the routine include pulsed I-V measurement with different pulse widths (using several voltage and current levels) as well as transient current measurement using different heating and measurement current levels. All the measurements are carried out for several discrete resistors attached on on-wafer test carriers. To demonstrate the usability of the setup, pulsed I-V and transient current measurement results of a THz Schottky diode are presented after the verification routine",
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Khanal, S, Kiuru, T, Mallat, J, Räisänen, AV & Närhi, T 2013, New verification routine for pulsed I-V and transient current measurement setup applied to a THz Schottky diode. in Proceedings of the: 43rd European Microwave Conference, EuMC 2013. Institute of Electrical and Electronic Engineers IEEE, pp. 1279 - 1282, 43rd European Microwave Conference, EuMC 2013, Nuremberg, Germany, 7/10/13. https://doi.org/10.23919/EuMC.2013.6686898

New verification routine for pulsed I-V and transient current measurement setup applied to a THz Schottky diode. / Khanal, S; Kiuru, Tero; Mallat, J; Räisänen, A V; Närhi, T.

Proceedings of the: 43rd European Microwave Conference, EuMC 2013. Institute of Electrical and Electronic Engineers IEEE, 2013. p. 1279 - 1282.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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AB - In this paper, a verification routine is developed for validating extremely fast pulsed I-V and transient current measurement setups. The measurements performed for the routine include pulsed I-V measurement with different pulse widths (using several voltage and current levels) as well as transient current measurement using different heating and measurement current levels. All the measurements are carried out for several discrete resistors attached on on-wafer test carriers. To demonstrate the usability of the setup, pulsed I-V and transient current measurement results of a THz Schottky diode are presented after the verification routine

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Khanal S, Kiuru T, Mallat J, Räisänen AV, Närhi T. New verification routine for pulsed I-V and transient current measurement setup applied to a THz Schottky diode. In Proceedings of the: 43rd European Microwave Conference, EuMC 2013. Institute of Electrical and Electronic Engineers IEEE. 2013. p. 1279 - 1282 https://doi.org/10.23919/EuMC.2013.6686898