Abstract
In this paper, a verification routine is developed for
validating extremely fast pulsed I-V and transient
current measurement setups. The measurements performed
for the routine include pulsed I-V measurement with
different pulse widths (using several voltage and current
levels) as well as transient current measurement using
different heating and measurement current levels. All the
measurements are carried out for several discrete
resistors attached on on-wafer test carriers. To
demonstrate the usability of the setup, pulsed I-V and
transient current measurement results of a THz Schottky
diode are presented after the verification routine
| Original language | English |
|---|---|
| Title of host publication | 43rd European Microwave Conference, EuMC 2013 |
| Publisher | IEEE Institute of Electrical and Electronic Engineers |
| Pages | 1279-1282 |
| ISBN (Print) | 978-2-87487-031-6 |
| DOIs | |
| Publication status | Published - 2013 |
| MoE publication type | A4 Article in a conference publication |
| Event | 43rd European Microwave Conference, EuMC 2013: Held as Part of the 16th European Microwave Week - Nuremberg, Germany Duration: 7 Oct 2013 → 10 Oct 2013 Conference number: 43 |
Conference
| Conference | 43rd European Microwave Conference, EuMC 2013 |
|---|---|
| Abbreviated title | EuMC 2013 |
| Country/Territory | Germany |
| City | Nuremberg |
| Period | 7/10/13 → 10/10/13 |
Keywords
- Pulsed I-V
- schottky diode
- thermal impedance
- transient current measurement