Ni-Cr-based thin-film resistors have been fabricated and studied at temperatures of down to 50 mK. The resistivity of the films varied within (14-25)Omega*sq, depending on the additions of Cu, Al, Ge, and Mn. The minimum temperature coefficient (TC) at 4.2 K (TC = -50 middot 10 -6 /K) is obtained for Ni 75 Cr 20 CU 2.5 AI 2.5 (Evanohm alloy) doped with 2.5% Ge. At the 50-150 mK range, the TC of the alloy increases to -4.15 middot 10 -6 /mK. The resistors demonstrate the Kondo minimum at 20-30 K. The power coefficient of the 560-kOmega sample, which was measured at 4.2 K, was found to be les -0.008 middot 10 -6 /muW. Power dependence measurements at subkelvin temperatures showed an electron overheating at the power level of above 10 p W for a 500-k film resistor.
|Journal||IEEE Transactions on Instrumentation and Measurement|
|Publication status||Published - 2009|
|MoE publication type||A1 Journal article-refereed|
- Accurate measurements
- low temperature
Satrapinski, A. F., Savin, A. M., Novikov, S., & Hahtela, O. M. (2009). Ni-Cr-Based Thin-Film Cryoresistors. IEEE Transactions on Instrumentation and Measurement, 58(4), 1206-1210. https://doi.org/10.1109/TIM.2008.2008579