Abstract
This letter reports the demonstration of N-polar Al0.8Ga0.2N/AlN continuously-graded-channel polarization-doped field-effect transistors (PolFETs) on SiC. A PolFET with a source to drain distance of 12 μm exhibited a maximum drain current of 62.8 mA/mm and an ON/OFF current ratio of 1.1× 104. The maximum drain current was stable between 20 °C and 250 °C operating temperatures. With the addition of 30-nm-thick Al2O3 gate insulator the maximum drain current increased to 126 mA/mm.
| Original language | English |
|---|---|
| Article number | 8741077 |
| Pages (from-to) | 1245-1248 |
| Number of pages | 4 |
| Journal | IEEE Electron Device Letters |
| Volume | 40 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 1 Aug 2019 |
| MoE publication type | A1 Journal article-refereed |
Keywords
- aluminum-gallium-nitride
- nitrogen-polar
- polarization doping
- Ultrawide-bandgap
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