Frequency fluctuation in an rf‐biased R‐SQUID noise thermometer operating in an nonhysteretic mode is examined. The noise sources caused by the shunt resistor and by the dissipative elements in the tank circuit are included in the model. The results demonstrate that the noise in the tank circuit has a significant influence on the accuracy of the Josephson junction noise thermometer.
|Journal||Journal of Applied Physics|
|Publication status||Published - 1984|
|MoE publication type||A1 Journal article-refereed|
- Josephson junction