Noise properties in an rf-biased Josephson junction noise thermometer

    Research output: Contribution to journalArticleScientificpeer-review

    8 Citations (Scopus)

    Abstract

    Frequency fluctuation in an rf‐biased R‐SQUID noise thermometer operating in an nonhysteretic mode is examined. The noise sources caused by the shunt resistor and by the dissipative elements in the tank circuit are included in the model. The results demonstrate that the noise in the tank circuit has a significant influence on the accuracy of the Josephson junction noise thermometer.
    Original languageEnglish
    Pages (from-to)1578 - 1580
    Number of pages3
    JournalJournal of Applied Physics
    Volume55
    Issue number6
    DOIs
    Publication statusPublished - 1984
    MoE publication typeNot Eligible

    Fingerprint

    thermometers
    Josephson junctions
    shunts
    resistors

    Keywords

    • Josephson junction

    Cite this

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    title = "Noise properties in an rf-biased Josephson junction noise thermometer",
    abstract = "Frequency fluctuation in an rf‐biased R‐SQUID noise thermometer operating in an nonhysteretic mode is examined. The noise sources caused by the shunt resistor and by the dissipative elements in the tank circuit are included in the model. The results demonstrate that the noise in the tank circuit has a significant influence on the accuracy of the Josephson junction noise thermometer.",
    keywords = "Josephson junction",
    author = "Heikki Sepp{\"a}",
    year = "1984",
    doi = "10.1063/1.333417",
    language = "English",
    volume = "55",
    pages = "1578 -- 1580",
    journal = "Journal of Applied Physics",
    issn = "0021-8979",
    publisher = "American Institute of Physics AIP",
    number = "6",

    }

    Noise properties in an rf-biased Josephson junction noise thermometer. / Seppä, Heikki.

    In: Journal of Applied Physics, Vol. 55, No. 6, 1984, p. 1578 - 1580.

    Research output: Contribution to journalArticleScientificpeer-review

    TY - JOUR

    T1 - Noise properties in an rf-biased Josephson junction noise thermometer

    AU - Seppä, Heikki

    PY - 1984

    Y1 - 1984

    N2 - Frequency fluctuation in an rf‐biased R‐SQUID noise thermometer operating in an nonhysteretic mode is examined. The noise sources caused by the shunt resistor and by the dissipative elements in the tank circuit are included in the model. The results demonstrate that the noise in the tank circuit has a significant influence on the accuracy of the Josephson junction noise thermometer.

    AB - Frequency fluctuation in an rf‐biased R‐SQUID noise thermometer operating in an nonhysteretic mode is examined. The noise sources caused by the shunt resistor and by the dissipative elements in the tank circuit are included in the model. The results demonstrate that the noise in the tank circuit has a significant influence on the accuracy of the Josephson junction noise thermometer.

    KW - Josephson junction

    U2 - 10.1063/1.333417

    DO - 10.1063/1.333417

    M3 - Article

    VL - 55

    SP - 1578

    EP - 1580

    JO - Journal of Applied Physics

    JF - Journal of Applied Physics

    SN - 0021-8979

    IS - 6

    ER -