Noise properties in an rf-biased Josephson junction noise thermometer

Heikki Seppä

    Research output: Contribution to journalArticleScientificpeer-review

    8 Citations (Scopus)


    Frequency fluctuation in an rf‐biased R‐SQUID noise thermometer operating in an nonhysteretic mode is examined. The noise sources caused by the shunt resistor and by the dissipative elements in the tank circuit are included in the model. The results demonstrate that the noise in the tank circuit has a significant influence on the accuracy of the Josephson junction noise thermometer.
    Original languageEnglish
    Pages (from-to)1578-1580
    JournalJournal of Applied Physics
    Issue number6
    Publication statusPublished - 1984
    MoE publication typeA1 Journal article-refereed


    • Josephson junction


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