Noise properties in an rf-biased Josephson junction noise thermometer

Research output: Contribution to journalArticleScientificpeer-review

8 Citations (Scopus)

Abstract

Frequency fluctuation in an rf‐biased R‐SQUID noise thermometer operating in an nonhysteretic mode is examined. The noise sources caused by the shunt resistor and by the dissipative elements in the tank circuit are included in the model. The results demonstrate that the noise in the tank circuit has a significant influence on the accuracy of the Josephson junction noise thermometer.
Original languageEnglish
Pages (from-to)1578 - 1580
Number of pages3
JournalJournal of Applied Physics
Volume55
Issue number6
DOIs
Publication statusPublished - 1984
MoE publication typeNot Eligible

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thermometers
Josephson junctions
shunts
resistors

Keywords

  • Josephson junction

Cite this

@article{e0805dd9bbac4216b9943b4db4423ccc,
title = "Noise properties in an rf-biased Josephson junction noise thermometer",
abstract = "Frequency fluctuation in an rf‐biased R‐SQUID noise thermometer operating in an nonhysteretic mode is examined. The noise sources caused by the shunt resistor and by the dissipative elements in the tank circuit are included in the model. The results demonstrate that the noise in the tank circuit has a significant influence on the accuracy of the Josephson junction noise thermometer.",
keywords = "Josephson junction",
author = "Heikki Sepp{\"a}",
year = "1984",
doi = "10.1063/1.333417",
language = "English",
volume = "55",
pages = "1578 -- 1580",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics AIP",
number = "6",

}

Noise properties in an rf-biased Josephson junction noise thermometer. / Seppä, Heikki.

In: Journal of Applied Physics, Vol. 55, No. 6, 1984, p. 1578 - 1580.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Noise properties in an rf-biased Josephson junction noise thermometer

AU - Seppä, Heikki

PY - 1984

Y1 - 1984

N2 - Frequency fluctuation in an rf‐biased R‐SQUID noise thermometer operating in an nonhysteretic mode is examined. The noise sources caused by the shunt resistor and by the dissipative elements in the tank circuit are included in the model. The results demonstrate that the noise in the tank circuit has a significant influence on the accuracy of the Josephson junction noise thermometer.

AB - Frequency fluctuation in an rf‐biased R‐SQUID noise thermometer operating in an nonhysteretic mode is examined. The noise sources caused by the shunt resistor and by the dissipative elements in the tank circuit are included in the model. The results demonstrate that the noise in the tank circuit has a significant influence on the accuracy of the Josephson junction noise thermometer.

KW - Josephson junction

U2 - 10.1063/1.333417

DO - 10.1063/1.333417

M3 - Article

VL - 55

SP - 1578

EP - 1580

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 6

ER -