Noise properties in an rf-biased Josephson junction noise thermometer

    Research output: Contribution to journalArticleScientificpeer-review

    8 Citations (Scopus)

    Abstract

    Frequency fluctuation in an rf‐biased R‐SQUID noise thermometer operating in an nonhysteretic mode is examined. The noise sources caused by the shunt resistor and by the dissipative elements in the tank circuit are included in the model. The results demonstrate that the noise in the tank circuit has a significant influence on the accuracy of the Josephson junction noise thermometer.
    Original languageEnglish
    Pages (from-to)1578 - 1580
    Number of pages3
    JournalJournal of Applied Physics
    Volume55
    Issue number6
    DOIs
    Publication statusPublished - 1984
    MoE publication typeNot Eligible

    Keywords

    • Josephson junction

    Fingerprint Dive into the research topics of 'Noise properties in an rf-biased Josephson junction noise thermometer'. Together they form a unique fingerprint.

    Cite this