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Nonlinear microscopy of nano-objects using excitation beam profiles with engineered phase jumps

  • L. Turquet
  • , J. P. Kakko
  • , L. Karvonen
  • , H. Jiang
  • , T. J. Isotalo
  • , T. Huhtio
  • , T. Niemi
  • , E. Kauppinen
  • , H. Lipsanen
  • , M. Kauranen
  • , G. Bautista
  • Tampere University of Technology (TUT)
  • Aalto University

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

We introduce nonlinear microscopy with phase-engineered incident beams. By controlling the phase across an incident Hermite-Gaussian HG10 beam, we vary the longitudinal electric field component at focus, allowing tailoring of second-harmonic generation from vertically-oriented nanowires.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics
Subtitle of host publicationCLEO: 2016
PublisherIEEE Institute of Electrical and Electronic Engineers
ISBN (Electronic)978-1-943580-11-8
DOIs
Publication statusPublished - 16 Dec 2016
MoE publication typeA4 Article in a conference publication
Event2016 Conference on Lasers and Electro-Optics, CLEO 2016 - San Jose, United States
Duration: 5 Jun 201610 Jun 2016

Publication series

SeriesOptics InfoBase Conference Papers
ISSN2162-2701

Conference

Conference2016 Conference on Lasers and Electro-Optics, CLEO 2016
Country/TerritoryUnited States
CitySan Jose
Period5/06/1610/06/16

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