Novel method for evaluation of fracture toughness of thin surface coatings by stress simulation and scratch test

Research output: Chapter in Book/Report/Conference proceeding › Chapter or book article › Scientific

Original language	English
Title of host publication	Current Trends in Tribology
Editors	K. Vercammen, K. Van Acker, J. Meneve
Place of Publication	Radom
Publisher	Institute for Technology - National Research Institute
Pages	29-32
ISBN (Print)	83-70204-418-X
Publication status	Published - 2004
MoE publication type	B2 Part of a book or another research book

Cite this

@inbook{b64a184eddea46938017ad2730bb156b,

title = "Novel method for evaluation of fracture toughness of thin surface coatings by stress simulation and scratch test",

author = "Anssi Laukkanen and Kim Wallin and Kenneth Holmberg and Helena Ronkainen and Simo Varjus",

note = "Project code: G3SU00194",

year = "2004",

language = "English",

isbn = "83-70204-418-X",

pages = "29--32",

editor = "K. Vercammen and \{Van Acker\}, K. and J. Meneve",

booktitle = "Current Trends in Tribology",

publisher = "Institute for Technology - National Research Institute",

address = "Poland",

}

Novel method for evaluation of fracture toughness of thin surface coatings by stress simulation and scratch test. / Laukkanen, Anssi; Wallin, Kim; Holmberg, Kenneth et al.
Current Trends in Tribology. ed. / K. Vercammen; K. Van Acker; J. Meneve. Radom: Institute for Technology - National Research Institute, 2004. p. 29-32.

Research output: Chapter in Book/Report/Conference proceeding › Chapter or book article › Scientific

TY - CHAP

T1 - Novel method for evaluation of fracture toughness of thin surface coatings by stress simulation and scratch test

AU - Laukkanen, Anssi

AU - Wallin, Kim

AU - Holmberg, Kenneth

AU - Ronkainen, Helena

AU - Varjus, Simo

N1 - Project code: G3SU00194

PY - 2004

Y1 - 2004

M3 - Chapter or book article

SN - 83-70204-418-X

SP - 29

EP - 32

BT - Current Trends in Tribology

A2 - Vercammen, K.

A2 - Van Acker, K.

A2 - Meneve, J.

PB - Institute for Technology - National Research Institute

CY - Radom

ER -