Numerical calculation of critical current in Bi-2223 stacked tapes

Wansoo Nah, Joonsun Kang, Seyong Choi, H. Han Park, Jinho Joo, Young Kil Kwon, Sang Soo Oh, Kang Sik Ryu, Jaakko Paasi, Jorma Lehtonen

Research output: Contribution to journalArticle in a proceedings journalScientificpeer-review

5 Citations (Scopus)

Abstract

As we stack HTS tapes, the critical current of stacked tapes is much less than the total summation of the critical current of each tape. This is mainly due to self magnetic field effects, and its behavior has been analyzed by load line or numerical methods with some assumptions. In this paper, we propose a simple numerical model to calculate the critical current of stacked tapes more exactly. To do this, we measured Jc-B curves of a HTS tape for various values of external magnetic fields and the angles between the magnetic field and the tape surface. Using this experimental data, the current density distribution in the cross section of stacked tapes is calculated numerically and the results are compared to both experimental values and the ones from load line analysis method, calculated simply by assuming uniform current density across the tapes.

Original languageEnglish
Pages (from-to)3908-3911
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume11
Issue number1 III
DOIs
Publication statusPublished - 1 Mar 2001
MoE publication typeA4 Article in a conference publication
Event2000 Applied Superconductivity Conference - Virginia Beach, VA, United States
Duration: 17 Sep 200022 Sep 2000

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    Nah, W., Kang, J., Choi, S., Park, H. H., Joo, J., Kwon, Y. K., Oh, S. S., Ryu, K. S., Paasi, J., & Lehtonen, J. (2001). Numerical calculation of critical current in Bi-2223 stacked tapes. IEEE Transactions on Applied Superconductivity, 11(1 III), 3908-3911. https://doi.org/10.1109/77.919924