Numerical calculation of critical current in Bi-2223 stacked tapes

Wansoo Nah; Joonsun Kang; Seyong Choi; H. Han Park; Jinho Joo; Young Kil Kwon; Sang Soo Oh; Kang Sik Ryu; Jaakko Paasi; Jorma Lehtonen

doi:10.1109/77.919924

Numerical calculation of critical current in Bi-2223 stacked tapes

Wansoo Nah, Joonsun Kang, Seyong Choi, H. Han Park, Jinho Joo, Young Kil Kwon, Sang Soo Oh, Kang Sik Ryu, Jaakko Paasi, Jorma Lehtonen

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Research output: Contribution to journal › Article in a proceedings journal › Scientific › peer-review

5 Citations (Scopus)

Abstract

As we stack HTS tapes, the critical current of stacked tapes is much less than the total summation of the critical current of each tape. This is mainly due to self magnetic field effects, and its behavior has been analyzed by load line or numerical methods with some assumptions. In this paper, we propose a simple numerical model to calculate the critical current of stacked tapes more exactly. To do this, we measured J_c-B curves of a HTS tape for various values of external magnetic fields and the angles between the magnetic field and the tape surface. Using this experimental data, the current density distribution in the cross section of stacked tapes is calculated numerically and the results are compared to both experimental values and the ones from load line analysis method, calculated simply by assuming uniform current density across the tapes.

Original language	English
Pages (from-to)	3908-3911
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	11
Issue number	1 III
DOIs	https://doi.org/10.1109/77.919924
Publication status	Published - 1 Mar 2001
MoE publication type	A4 Article in a conference publication
Event	2000 Applied Superconductivity Conference - Virginia Beach, VA, United States Duration: 17 Sept 2000 → 22 Sept 2000

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10.1109/77.919924

Cite this

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title = "Numerical calculation of critical current in Bi-2223 stacked tapes",

abstract = "As we stack HTS tapes, the critical current of stacked tapes is much less than the total summation of the critical current of each tape. This is mainly due to self magnetic field effects, and its behavior has been analyzed by load line or numerical methods with some assumptions. In this paper, we propose a simple numerical model to calculate the critical current of stacked tapes more exactly. To do this, we measured Jc-B curves of a HTS tape for various values of external magnetic fields and the angles between the magnetic field and the tape surface. Using this experimental data, the current density distribution in the cross section of stacked tapes is calculated numerically and the results are compared to both experimental values and the ones from load line analysis method, calculated simply by assuming uniform current density across the tapes.",

author = "Wansoo Nah and Joonsun Kang and Seyong Choi and Park, {H. Han} and Jinho Joo and Kwon, {Young Kil} and Oh, {Sang Soo} and Ryu, {Kang Sik} and Jaakko Paasi and Jorma Lehtonen",

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TY - JOUR

T1 - Numerical calculation of critical current in Bi-2223 stacked tapes

AU - Nah, Wansoo

AU - Kang, Joonsun

AU - Choi, Seyong

AU - Park, H. Han

AU - Joo, Jinho

AU - Kwon, Young Kil

AU - Oh, Sang Soo

AU - Ryu, Kang Sik

AU - Paasi, Jaakko

AU - Lehtonen, Jorma

PY - 2001/3/1

Y1 - 2001/3/1

N2 - As we stack HTS tapes, the critical current of stacked tapes is much less than the total summation of the critical current of each tape. This is mainly due to self magnetic field effects, and its behavior has been analyzed by load line or numerical methods with some assumptions. In this paper, we propose a simple numerical model to calculate the critical current of stacked tapes more exactly. To do this, we measured Jc-B curves of a HTS tape for various values of external magnetic fields and the angles between the magnetic field and the tape surface. Using this experimental data, the current density distribution in the cross section of stacked tapes is calculated numerically and the results are compared to both experimental values and the ones from load line analysis method, calculated simply by assuming uniform current density across the tapes.

AB - As we stack HTS tapes, the critical current of stacked tapes is much less than the total summation of the critical current of each tape. This is mainly due to self magnetic field effects, and its behavior has been analyzed by load line or numerical methods with some assumptions. In this paper, we propose a simple numerical model to calculate the critical current of stacked tapes more exactly. To do this, we measured Jc-B curves of a HTS tape for various values of external magnetic fields and the angles between the magnetic field and the tape surface. Using this experimental data, the current density distribution in the cross section of stacked tapes is calculated numerically and the results are compared to both experimental values and the ones from load line analysis method, calculated simply by assuming uniform current density across the tapes.

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JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

IS - 1 III

T2 - 2000 Applied Superconductivity Conference

Y2 - 17 September 2000 through 22 September 2000

ER -

Numerical calculation of critical current in Bi-2223 stacked tapes

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