On the assessment of relevant roughness parameters for microwave remote sensing

Francesco Mattia; Thuy Le Toan; Malcolm Davidson; Terhikki Manninen; Pierre Borderies; Maurice Borgeaud

doi:10.1109/IGARSS.1998.691353

On the assessment of relevant roughness parameters for microwave remote sensing

Francesco Mattia, Thuy Le Toan, Malcolm Davidson, Terhikki Manninen, Pierre Borderies, Maurice Borgeaud

VTT Technical Research Centre of Finland

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Abstract

The objective of this paper is to investigate the potential of a multi-scale roughness description in order to better understand the EM scattering from natural bare soils. By using a previous approach which incorporates a multi-scale description of natural surfaces into available asymptotic scattering models, a comparison between theoretical and experimental results acquired over two different sites is carried out.

Original language	English
Title of host publication	IGARSS '98: Sensing and Managing the Environment
Subtitle of host publication	1998 IEEE International Geoscience and Remote Sensing Symposium
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	1210-1212
ISBN (Print)	978-0-7803-4403-7
DOIs	https://doi.org/10.1109/IGARSS.1998.691353
Publication status	Published - 1998
MoE publication type	A4 Article in a conference publication
Event	1998 IEEE International Geoscience and Remote Sensing Symposium - Sheraton, Seattle, United States Duration: 6 Jul 1998 → 10 Jul 1998

Conference

Conference	1998 IEEE International Geoscience and Remote Sensing Symposium
Country/Territory	United States
City	Seattle
Period	6/07/98 → 10/07/98

Keywords

remote sensing

Access to Document

10.1109/IGARSS.1998.691353

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Mattia, F., Le Toan, T., Davidson, M., Manninen, T., Borderies, P., & Borgeaud, M. (1998). On the assessment of relevant roughness parameters for microwave remote sensing. In IGARSS '98: Sensing and Managing the Environment: 1998 IEEE International Geoscience and Remote Sensing Symposium (pp. 1210-1212). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/IGARSS.1998.691353

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title = "On the assessment of relevant roughness parameters for microwave remote sensing",

abstract = "The objective of this paper is to investigate the potential of a multi-scale roughness description in order to better understand the EM scattering from natural bare soils. By using a previous approach which incorporates a multi-scale description of natural surfaces into available asymptotic scattering models, a comparison between theoretical and experimental results acquired over two different sites is carried out.",

keywords = "remote sensing",

author = "Francesco Mattia and \{Le Toan\}, Thuy and Malcolm Davidson and Terhikki Manninen and Pierre Borderies and Maurice Borgeaud",

year = "1998",

doi = "10.1109/IGARSS.1998.691353",

language = "English",

isbn = "978-0-7803-4403-7",

pages = "1210--1212",

booktitle = "IGARSS '98: Sensing and Managing the Environment",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

note = "1998 IEEE International Geoscience and Remote Sensing Symposium ; Conference date: 06-07-1998 Through 10-07-1998",

}

Mattia, F, Le Toan, T, Davidson, M, Manninen, T, Borderies, P & Borgeaud, M 1998, On the assessment of relevant roughness parameters for microwave remote sensing. in IGARSS '98: Sensing and Managing the Environment: 1998 IEEE International Geoscience and Remote Sensing Symposium. IEEE Institute of Electrical and Electronic Engineers, pp. 1210-1212, 1998 IEEE International Geoscience and Remote Sensing Symposium, Seattle, Washington, United States, 6/07/98. https://doi.org/10.1109/IGARSS.1998.691353

On the assessment of relevant roughness parameters for microwave remote sensing. / Mattia, Francesco; Le Toan, Thuy; Davidson, Malcolm et al.
IGARSS '98: Sensing and Managing the Environment: 1998 IEEE International Geoscience and Remote Sensing Symposium. IEEE Institute of Electrical and Electronic Engineers, 1998. p. 1210-1212.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - On the assessment of relevant roughness parameters for microwave remote sensing

AU - Mattia, Francesco

AU - Le Toan, Thuy

AU - Davidson, Malcolm

AU - Manninen, Terhikki

AU - Borderies, Pierre

AU - Borgeaud, Maurice

PY - 1998

Y1 - 1998

N2 - The objective of this paper is to investigate the potential of a multi-scale roughness description in order to better understand the EM scattering from natural bare soils. By using a previous approach which incorporates a multi-scale description of natural surfaces into available asymptotic scattering models, a comparison between theoretical and experimental results acquired over two different sites is carried out.

AB - The objective of this paper is to investigate the potential of a multi-scale roughness description in order to better understand the EM scattering from natural bare soils. By using a previous approach which incorporates a multi-scale description of natural surfaces into available asymptotic scattering models, a comparison between theoretical and experimental results acquired over two different sites is carried out.

KW - remote sensing

U2 - 10.1109/IGARSS.1998.691353

DO - 10.1109/IGARSS.1998.691353

M3 - Conference article in proceedings

SN - 978-0-7803-4403-7

SP - 1210

EP - 1212

BT - IGARSS '98: Sensing and Managing the Environment

PB - IEEE Institute of Electrical and Electronic Engineers

T2 - 1998 IEEE International Geoscience and Remote Sensing Symposium

Y2 - 6 July 1998 through 10 July 1998

ER -

Mattia F, Le Toan T, Davidson M, Manninen T, Borderies P, Borgeaud M. On the assessment of relevant roughness parameters for microwave remote sensing. In IGARSS '98: Sensing and Managing the Environment: 1998 IEEE International Geoscience and Remote Sensing Symposium. IEEE Institute of Electrical and Electronic Engineers. 1998. p. 1210-1212 doi: 10.1109/IGARSS.1998.691353

On the assessment of relevant roughness parameters for microwave remote sensing

Abstract

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Keywords

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