On-wafer noise parameter measurements at 60 GHz

Manu Lahdes, Markku Sipilä, Jussi Tuovinen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Original languageEnglish
Title of host publicationInternational IEEE Workshop on Experimentally Based FET Device Modelling & Related Nonlinear Circuit Design
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages13.1-13.6
Publication statusPublished - 1997
MoE publication typeA4 Article in a conference publication
EventIEEE Workshop on Experimentally based FET Device Modelling & Related Nonlinear Circuit Design - Kassel, Germany
Duration: 17 Jul 199718 Jul 1997

Conference

ConferenceIEEE Workshop on Experimentally based FET Device Modelling & Related Nonlinear Circuit Design
CountryGermany
CityKassel
Period17/07/9718/07/97

Cite this