Online quality assurance of microchannels in roll-to-roll by optical coherence tomography

Janne Lauri, Christina Liedert, Ralph Liedert, Tapio Fabritius

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

Roll-to-roll (R2R) process is an emerging technology to manufacture printed electronics, microfluidics, biochemical sensors etc. The requirements for high quality and small tolerances at the manufacturing phase are of the essence for such products. To verify the quality and guarantee the high production yield, high speed, non-destructive testing methods are needed. In this paper, optical coherence tomography (OCT) device is used at the R2R-line to measure online hot embossed microchannel structures at speed of 1 m/min, which is typical for the hot embossing process. The channel's width and shape are determined along the web. The applicability of OCT for topography measurements is demonstrated in an actual R2R environment.

Original languageEnglish
Title of host publication2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
PublisherIEEE Institute of Electrical and Electronic Engineers
Number of pages5
ISBN (Electronic)978-1-7281-4460-3
ISBN (Print)978-1-7281-4461-0
DOIs
Publication statusPublished - 2020
MoE publication typeA4 Article in a conference publication
Event2020 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2020 - Dubrovnik, Croatia
Duration: 25 May 202029 May 2020

Conference

Conference2020 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2020
CountryCroatia
CityDubrovnik
Period25/05/2029/05/20

Keywords

  • Non-destructive testing
  • Online measurement
  • Profilometer
  • Surface topography

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  • Cite this

    Lauri, J., Liedert, C., Liedert, R., & Fabritius, T. (2020). Online quality assurance of microchannels in roll-to-roll by optical coherence tomography. In 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/I2MTC43012.2020.9128465