Skip to main navigation Skip to search Skip to main content

Optical amplifier for femtosecond frequency comb measurements near 633 nm

  • M. Vainio*
  • , Mikko Merimaa
  • , Kaj Nyholm
  • *Corresponding author for this work
  • Centre for Metrology and Accreditation Finland (MIKES)
  • Helsinki University of Technology

Research output: Contribution to journalArticleScientificpeer-review

Fingerprint

Dive into the research topics of 'Optical amplifier for femtosecond frequency comb measurements near 633 nm'. Together they form a unique fingerprint.
Sort by

Keyphrases

Physics

INIS