Abstract
Hydrogenated amorphous silicon films have been prepared by reactive sputtering under various deposition conditions. The films have been systematically studied by means of conductivity, ESR, optical and IR-absorption and magnetoresistance measurements. The optical and electrical properties of the films were found not to be exclusively determined by hydrogen concentration, but also strongly dependent on deposition temperature.
Original language | English |
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Pages (from-to) | 372-377 |
Journal | Physica Scripta |
Volume | 29 |
Issue number | 4 |
DOIs | |
Publication status | Published - 1984 |
MoE publication type | A1 Journal article-refereed |