Abstract
Hydrogenated amorphous silicon films have been prepared by reactive sputtering under various deposition conditions. The films have been systematically studied by means of conductivity, ESR, optical and IR-absorption and magnetoresistance measurements. The optical and electrical properties of the films were found not to be exclusively determined by hydrogen concentration, but also strongly dependent on deposition temperature.
| Original language | English |
|---|---|
| Pages (from-to) | 372-377 |
| Journal | Physica Scripta |
| Volume | 29 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 1984 |
| MoE publication type | A1 Journal article-refereed |
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