Skip to main navigation Skip to search Skip to main content

Optical modal gain in multiple quantum-well semiconductor lasers based on InP

  • M.S. Wartak*
  • , P. Weetman
  • , Teemu Alajoki
  • , Janne Aikio
  • , Veli Heikkinen
  • , N. A. Pikhtin
  • , P. Rusek
  • *Corresponding author for this work
    • Wilfrid Laurier University
    • Russian Academy of Sciences (RAS)
    • Wrocław University of Science and Technology

    Research output: Contribution to journalArticleScientificpeer-review

    Abstract

    An approach to determine the optical modal gain spectra in multiple quantum-well semiconductor lasers based on InP in terms of the current at electrodes is presented. The link between the current at the electrodes and the density of carriers inside each quantum well was provided by rate equations with the inclusion of carrier transport effects. Description of hole dispersion is based on a 4 × 4 Luttinger–Kohn Hamiltonian and was done with the electrostatic effects of the carrier charges. Electrostatic effects were included via a self-consistent solution of electron and hole wave equations and the Poisson equation. The optical gain for the TE (transverse electric) mode has been determined with the inclusion of non-Markovian effects, Coulombic enhancement, and band-gap renormalization. The theoretical approach was compared with experimental measurements of the optical gain on a laser structure consisting of four quantum wells using the Hakki–Paoli method. The important role played by the leakage current was revealed when the results were compared.
    Original languageEnglish
    Pages (from-to)53-66
    JournalCanadian Journal of Physics
    Volume84
    Issue number1
    DOIs
    Publication statusPublished - 2006
    MoE publication typeA1 Journal article-refereed

    Keywords

    • quantum wells
    • semiconductor lasers

    Fingerprint

    Dive into the research topics of 'Optical modal gain in multiple quantum-well semiconductor lasers based on InP'. Together they form a unique fingerprint.

    Cite this