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Optical scanning system for quality control of GEM-foils

  • M. Kalliokoski*
  • , T. Hilden
  • , F. Garcia
  • , J. Heino
  • , R. Lauhakangas
  • , Eija Tuominen
  • , R. Turpeinen
  • *Corresponding author for this work
  • University of Helsinki

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