Optical scattering of nanocrystalline Pb(ZrxTi1-x)O3 films

Jarkko Puustinen (Corresponding Author), Jyrki Lappalainen, Jussi Hiltunen, Vilho Lantto

    Research output: Contribution to journalArticleScientificpeer-review

    3 Citations (Scopus)


    Optical characterization methods, like spectrophotometry at UV–vis-NIR wavelengths and prism-coupler method, were applied to polycrystalline Pb(ZrxTi1−x)O3 thin films at various thicknesses. Thin films were deposited at room temperature by pulsed laser deposition on MgO (1 0 0) substrates and post-annealed at different temperatures. X-ray diffraction and atomic force microscopy were used to characterize the crystal structure and surface morphology of the thin films, respectively.

    Well oscillating transmission with a sharp fall near the absorption edge was found in films with high orientation and low surface roughness. Changes in the surface morphology and crystal orientation were found to modulate optical interference maxima and minima of the transmittance spectra and to increase the width of the TE0 mode (Δβ ≈ 0.06) indicating an increase in the scattering losses of the films. Single-phase oriented films had sharpest coupling values (Δβ ≈ 0.005) of the TE0 mode.
    Original languageEnglish
    Pages (from-to)429-434
    Number of pages6
    JournalJournal of the European Ceramic Society
    Issue number2
    Publication statusPublished - 2010
    MoE publication typeA1 Journal article-refereed


    • Films
    • Grain size
    • Optical properties
    • PZT


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