Optical scattering of nanocrystalline Pb(ZrxTi1-x)O3 films

Jarkko Puustinen (Corresponding Author), Jyrki Lappalainen, Jussi Hiltunen, Vilho Lantto

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)

Abstract

Optical characterization methods, like spectrophotometry at UV–vis-NIR wavelengths and prism-coupler method, were applied to polycrystalline Pb(ZrxTi1−x)O3 thin films at various thicknesses. Thin films were deposited at room temperature by pulsed laser deposition on MgO (1 0 0) substrates and post-annealed at different temperatures. X-ray diffraction and atomic force microscopy were used to characterize the crystal structure and surface morphology of the thin films, respectively.

Well oscillating transmission with a sharp fall near the absorption edge was found in films with high orientation and low surface roughness. Changes in the surface morphology and crystal orientation were found to modulate optical interference maxima and minima of the transmittance spectra and to increase the width of the TE0 mode (Δβ ≈ 0.06) indicating an increase in the scattering losses of the films. Single-phase oriented films had sharpest coupling values (Δβ ≈ 0.005) of the TE0 mode.
Original languageEnglish
Pages (from-to)429-434
Number of pages6
JournalJournal of the European Ceramic Society
Volume30
Issue number2
DOIs
Publication statusPublished - 2010
MoE publication typeA1 Journal article-refereed

Fingerprint

Scattering
Thin films
Surface morphology
Light interference
Spectrophotometry
Pulsed laser deposition
Prisms
Crystal orientation
Atomic force microscopy
Crystal structure
Surface roughness
X ray diffraction
Wavelength
Temperature
Substrates

Keywords

  • Films
  • Grain size
  • Optical properties
  • PZT

Cite this

Puustinen, Jarkko ; Lappalainen, Jyrki ; Hiltunen, Jussi ; Lantto, Vilho. / Optical scattering of nanocrystalline Pb(ZrxTi1-x)O3 films. In: Journal of the European Ceramic Society. 2010 ; Vol. 30, No. 2. pp. 429-434.
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Optical scattering of nanocrystalline Pb(ZrxTi1-x)O3 films. / Puustinen, Jarkko (Corresponding Author); Lappalainen, Jyrki; Hiltunen, Jussi; Lantto, Vilho.

In: Journal of the European Ceramic Society, Vol. 30, No. 2, 2010, p. 429-434.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Optical scattering of nanocrystalline Pb(ZrxTi1-x)O3 films

AU - Puustinen, Jarkko

AU - Lappalainen, Jyrki

AU - Hiltunen, Jussi

AU - Lantto, Vilho

PY - 2010

Y1 - 2010

N2 - Optical characterization methods, like spectrophotometry at UV–vis-NIR wavelengths and prism-coupler method, were applied to polycrystalline Pb(ZrxTi1−x)O3 thin films at various thicknesses. Thin films were deposited at room temperature by pulsed laser deposition on MgO (1 0 0) substrates and post-annealed at different temperatures. X-ray diffraction and atomic force microscopy were used to characterize the crystal structure and surface morphology of the thin films, respectively.Well oscillating transmission with a sharp fall near the absorption edge was found in films with high orientation and low surface roughness. Changes in the surface morphology and crystal orientation were found to modulate optical interference maxima and minima of the transmittance spectra and to increase the width of the TE0 mode (Δβ ≈ 0.06) indicating an increase in the scattering losses of the films. Single-phase oriented films had sharpest coupling values (Δβ ≈ 0.005) of the TE0 mode.

AB - Optical characterization methods, like spectrophotometry at UV–vis-NIR wavelengths and prism-coupler method, were applied to polycrystalline Pb(ZrxTi1−x)O3 thin films at various thicknesses. Thin films were deposited at room temperature by pulsed laser deposition on MgO (1 0 0) substrates and post-annealed at different temperatures. X-ray diffraction and atomic force microscopy were used to characterize the crystal structure and surface morphology of the thin films, respectively.Well oscillating transmission with a sharp fall near the absorption edge was found in films with high orientation and low surface roughness. Changes in the surface morphology and crystal orientation were found to modulate optical interference maxima and minima of the transmittance spectra and to increase the width of the TE0 mode (Δβ ≈ 0.06) indicating an increase in the scattering losses of the films. Single-phase oriented films had sharpest coupling values (Δβ ≈ 0.005) of the TE0 mode.

KW - Films

KW - Grain size

KW - Optical properties

KW - PZT

U2 - 10.1016/j.jeurceramsoc.2009.05.047

DO - 10.1016/j.jeurceramsoc.2009.05.047

M3 - Article

VL - 30

SP - 429

EP - 434

JO - Journal of the European Ceramic Society

JF - Journal of the European Ceramic Society

SN - 0955-2219

IS - 2

ER -