Optical scattering of nanocrystalline Pb(ZrxTi1-x)O3 films

Jarkko Puustinen; Jyrki Lappalainen; Jussi Hiltunen; Vilho Lantto

doi:10.1016/j.jeurceramsoc.2009.05.047

Optical scattering of nanocrystalline Pb(Zr_xTi_1-x)O₃films

Jarkko Puustinen (Corresponding Author), Jyrki Lappalainen, Jussi Hiltunen, Vilho Lantto

University of Oulu

Research output: Contribution to journal › Article › Scientific › peer-review

Abstract

Optical characterization methods, like spectrophotometry at UV–vis-NIR wavelengths and prism-coupler method, were applied to polycrystalline Pb(Zr_xTi_1−x)O₃thin films at various thicknesses. Thin films were deposited at room temperature by pulsed laser deposition on MgO (1 0 0) substrates and post-annealed at different temperatures. X-ray diffraction and atomic force microscopy were used to characterize the crystal structure and surface morphology of the thin films, respectively.

Well oscillating transmission with a sharp fall near the absorption edge was found in films with high orientation and low surface roughness. Changes in the surface morphology and crystal orientation were found to modulate optical interference maxima and minima of the transmittance spectra and to increase the width of the TE₀ mode (Δβ ≈ 0.06) indicating an increase in the scattering losses of the films. Single-phase oriented films had sharpest coupling values (Δβ ≈ 0.005) of the TE0 mode.

Original language	English
Pages (from-to)	429-434
Number of pages	6
Journal	Journal of the European Ceramic Society
Volume	30
Issue number	2
DOIs	https://doi.org/10.1016/j.jeurceramsoc.2009.05.047
Publication status	Published - 2010
MoE publication type	A1 Journal article-refereed

Keywords

Films
Grain size
Optical properties
PZT

Access to Document

10.1016/j.jeurceramsoc.2009.05.047

Cite this

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title = "Optical scattering of nanocrystalline Pb(ZrxTi1-x)O3 films",

abstract = "Optical characterization methods, like spectrophotometry at UV–vis-NIR wavelengths and prism-coupler method, were applied to polycrystalline Pb(ZrxTi1−x)O3 thin films at various thicknesses. Thin films were deposited at room temperature by pulsed laser deposition on MgO (1 0 0) substrates and post-annealed at different temperatures. X-ray diffraction and atomic force microscopy were used to characterize the crystal structure and surface morphology of the thin films, respectively.Well oscillating transmission with a sharp fall near the absorption edge was found in films with high orientation and low surface roughness. Changes in the surface morphology and crystal orientation were found to modulate optical interference maxima and minima of the transmittance spectra and to increase the width of the TE0 mode (Δβ ≈ 0.06) indicating an increase in the scattering losses of the films. Single-phase oriented films had sharpest coupling values (Δβ ≈ 0.005) of the TE0 mode.",

keywords = "Films, Grain size, Optical properties, PZT",

author = "Jarkko Puustinen and Jyrki Lappalainen and Jussi Hiltunen and Vilho Lantto",

year = "2010",

doi = "10.1016/j.jeurceramsoc.2009.05.047",

language = "English",

volume = "30",

pages = "429--434",

journal = "Journal of the European Ceramic Society",

issn = "0955-2219",

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TY - JOUR

T1 - Optical scattering of nanocrystalline Pb(ZrxTi1-x)O3 films

AU - Puustinen, Jarkko

AU - Lappalainen, Jyrki

AU - Hiltunen, Jussi

AU - Lantto, Vilho

PY - 2010

Y1 - 2010

N2 - Optical characterization methods, like spectrophotometry at UV–vis-NIR wavelengths and prism-coupler method, were applied to polycrystalline Pb(ZrxTi1−x)O3 thin films at various thicknesses. Thin films were deposited at room temperature by pulsed laser deposition on MgO (1 0 0) substrates and post-annealed at different temperatures. X-ray diffraction and atomic force microscopy were used to characterize the crystal structure and surface morphology of the thin films, respectively.Well oscillating transmission with a sharp fall near the absorption edge was found in films with high orientation and low surface roughness. Changes in the surface morphology and crystal orientation were found to modulate optical interference maxima and minima of the transmittance spectra and to increase the width of the TE0 mode (Δβ ≈ 0.06) indicating an increase in the scattering losses of the films. Single-phase oriented films had sharpest coupling values (Δβ ≈ 0.005) of the TE0 mode.

AB - Optical characterization methods, like spectrophotometry at UV–vis-NIR wavelengths and prism-coupler method, were applied to polycrystalline Pb(ZrxTi1−x)O3 thin films at various thicknesses. Thin films were deposited at room temperature by pulsed laser deposition on MgO (1 0 0) substrates and post-annealed at different temperatures. X-ray diffraction and atomic force microscopy were used to characterize the crystal structure and surface morphology of the thin films, respectively.Well oscillating transmission with a sharp fall near the absorption edge was found in films with high orientation and low surface roughness. Changes in the surface morphology and crystal orientation were found to modulate optical interference maxima and minima of the transmittance spectra and to increase the width of the TE0 mode (Δβ ≈ 0.06) indicating an increase in the scattering losses of the films. Single-phase oriented films had sharpest coupling values (Δβ ≈ 0.005) of the TE0 mode.

KW - Films

KW - Grain size

KW - Optical properties

KW - PZT

U2 - 10.1016/j.jeurceramsoc.2009.05.047

DO - 10.1016/j.jeurceramsoc.2009.05.047

M3 - Article

SN - 0955-2219

VL - 30

SP - 429

EP - 434

JO - Journal of the European Ceramic Society

JF - Journal of the European Ceramic Society

IS - 2