Skip to main navigation
Skip to search
Skip to main content
VTT's Research Information Portal Home
Home
Profiles
Research output
Projects
Datasets
Research units
Research Infrastructures
Activities
Prizes
Press/Media
Impacts
Search by expertise, name or affiliation
Optical temperature measurements of silicon microbridge emitters
Maksim Shpak
*
, Lauri Sainiemi
, Maija Ojanen
, Petri Kärhä
,
Martti Heinonen
, Sami Franssila
, Erkki Ikonen
*
Corresponding author for this work
Aalto University
Research output
:
Contribution to journal
›
Article
›
Scientific
›
peer-review
2
Citations (Scopus)
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Optical temperature measurements of silicon microbridge emitters'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
INIS
levels
100%
silicon
100%
temperature measurement
100%
power
66%
spectra
66%
layers
33%
comparative evaluations
33%
stability
33%
interference
33%
sensitivity
33%
equations
33%
range
33%
thin films
33%
emission
33%
heat
33%
emissivity
33%
bridges
33%
temperature range
33%
light sources
33%
Engineering
Temperature Range
100%
Power Level
100%
Measured Spectrum
100%
Fresnel Equation
100%
Contact Temperature
100%
Thin Films
100%
Light Source
100%
Emissivity
100%
Keyphrases
Micro-bridge
100%
Optical Temperature Measurement
100%
Optical Measurement
33%
Emissivity
16%
Temperature Measurement
16%
Temperature Range
16%
Spectroscopic Measurement
16%
Light Source
16%
Wideband
16%
Measured Spectrum
16%
Power Level
16%
Multilayer Structure
16%
Low Power
16%
Glow
16%
Suspended Structure
16%
Fresnel Equations
16%
Applied Power
16%
Interference Effect
16%
Contact Temperature
16%
Incandescence
16%
Micro-thermocouple
16%
Material Science
Optical Measurement
100%
Silicon
100%
Thin Films
50%