Optimising primer residue removal with the aid of SIMS, purge and trap gas chromatography mass spectrometry and contact angle measurements

Sari Lehto, Jari Likonen, Tarja Riihisaari, A. Eränen, Arto Kiviranta, J. Virtanen, Erik Sandell

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, SIMS XII
    PublisherElsevier
    Pages719 - 722
    ISBN (Print)0-444-50323-4
    Publication statusPublished - 2000
    MoE publication typeA4 Article in a conference publication
    Event12th International Conference on Secondary Ion Mass Spectrometry, SIMS XII - Brussels, Belgium
    Duration: 5 Sep 199911 Sep 1999

    Conference

    Conference12th International Conference on Secondary Ion Mass Spectrometry, SIMS XII
    CountryBelgium
    CityBrussels
    Period5/09/9911/09/99

    Cite this

    Lehto, S., Likonen, J., Riihisaari, T., Eränen, A., Kiviranta, A., Virtanen, J., & Sandell, E. (2000). Optimising primer residue removal with the aid of SIMS, purge and trap gas chromatography mass spectrometry and contact angle measurements. In Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, SIMS XII (pp. 719 - 722). Elsevier.