Order in crystalline cellulose detected by atomic force microscopy (AFM)

Lauri Kuutti, Jaakko Pere, Jouko Peltonen, Olle Teleman

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

In this work we applied AFM for the surface study of cellulose microcrystals using highly crystalline Valonia macrophysa vesicles as the substrate. Vesicles were pretreated with dilute alkali and an excess of distilled water prior to imaging with AFM. An AFM image of a vesicle showed a group of closely packed microcrystals. A more detailed image of the membrane was also obtained. In the area of 14 × 14 nm2 the surface roughness was typically 1 nm. We calculated the two-dimensional fast fourier transform (FFT) of the raw data and obtained crystal parameters as well as a highly filtered inverse-transformed image. This image showed a periodicity of 1.01 nm, which may correspond to the fibre repeat unit length. Molecular modelling was used to generate a Connolly model surface of the crystalline cellulose. The data created thereby was converted to a format identical with the AFM image. The experimental images were compared with the synthetic images made by molecular modelling. Crystal surface 110 was found to fit very well to the experimental image.
Original languageEnglish
Title of host publicationCellulose and Cellulose Derivatives
Subtitle of host publicationPhysico-chemical Aspects and Industrial Applications
EditorsJohn F. Kennedy, Glyn O. Phillips, Peter A. Williams, Lennart Piculell
Place of PublicationCambridge
PublisherWoodhead Publishing
Pages69-74
ISBN (Electronic)978-1-84569-853-9
ISBN (Print)978-1-85573-212-4
DOIs
Publication statusPublished - 1995
MoE publication typeA4 Article in a conference publication
EventCellucon '93 - Lund, Sweden
Duration: 21 Jun 199324 Jun 1993

Conference

ConferenceCellucon '93
CountrySweden
CityLund
Period21/06/9324/06/93

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    Kuutti, L., Pere, J., Peltonen, J., & Teleman, O. (1995). Order in crystalline cellulose detected by atomic force microscopy (AFM). In J. F. Kennedy, G. O. Phillips, P. A. Williams, & L. Piculell (Eds.), Cellulose and Cellulose Derivatives: Physico-chemical Aspects and Industrial Applications (pp. 69-74). Woodhead Publishing. https://doi.org/10.1533/9781845698539.2.69