Orientation Dependent Dielectric Characteristics of Nanocrystalline Pb(ZrxTi1-x)O3 Films with Inter Digital Electrodes

J. Puustinen, J. Lappalainen, Jussi Hiltunen, V. Lantto, H. Jantunen

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Abstract

Crystal structure and dielectric properties of nanocrystalline Pb(ZrxTi1-x)O3 films were studied. Intensity of Raman mode E(1LO) was increased and peak around ∼580 cm−1 became symmetric and strong (110) crystal plane reflection was observed as the thickness of the films increased from 150 nm to 500 nm. Curie-temperature was found to decrease from ∼370°C to ∼345°C as the orientation changed from tetragonal to trigonal. Dielectric constant was found to be maximized and loss angle minimized for single phase oriented films, while phase co-existence was found to increase loss angle values, and bimodal dielectric maxima were found.
Original languageEnglish
Pages (from-to)227-235
Number of pages9
JournalFerroelectrics
Volume405
Issue number1
DOIs
Publication statusPublished - 2010
MoE publication typeA1 Journal article-refereed

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