Crystal structure and dielectric properties of nanocrystalline Pb(ZrxTi1-x)O3 films were studied. Intensity of Raman mode E(1LO) was increased and peak around ∼580 cm−1 became symmetric and strong (110) crystal plane reflection was observed as the thickness of the films increased from 150 nm to 500 nm. Curie-temperature was found to decrease from ∼370°C to ∼345°C as the orientation changed from tetragonal to trigonal. Dielectric constant was found to be maximized and loss angle minimized for single phase oriented films, while phase co-existence was found to increase loss angle values, and bimodal dielectric maxima were found.
Puustinen, J., Lappalainen, J., Hiltunen, J., Lantto, V., & Jantunen, H. (2010). Orientation Dependent Dielectric Characteristics of Nanocrystalline Pb(ZrxTi1-x)O3 Films with Inter Digital Electrodes. Ferroelectrics, 405(1), 227-235. https://doi.org/10.1080/00150193.2010.483377