Orientation Dependent Dielectric Characteristics of Nanocrystalline Pb(ZrxTi1-x)O3 Films with Inter Digital Electrodes

J. Puustinen; J. Lappalainen; Jussi Hiltunen; V. Lantto; H. Jantunen

doi:10.1080/00150193.2010.483377

Orientation Dependent Dielectric Characteristics of Nanocrystalline Pb(Zr_xTi_1-x)O₃Films with Inter Digital Electrodes

J. Puustinen
, J. Lappalainen
, Jussi Hiltunen
, V. Lantto
, H. Jantunen

University of Oulu

Research output: Contribution to journal › Article › Scientific › peer-review

1 Citation (Scopus)

Abstract

Crystal structure and dielectric properties of nanocrystalline Pb(Zr_xTi_1-x)O₃ films were studied. Intensity of Raman mode E(1LO) was increased and peak around ∼580 cm⁻¹ became symmetric and strong (110) crystal plane reflection was observed as the thickness of the films increased from 150 nm to 500 nm. Curie-temperature was found to decrease from ∼370°C to ∼345°C as the orientation changed from tetragonal to trigonal. Dielectric constant was found to be maximized and loss angle minimized for single phase oriented films, while phase co-existence was found to increase loss angle values, and bimodal dielectric maxima were found.

Original language	English
Pages (from-to)	227-235
Number of pages	9
Journal	Ferroelectrics
Volume	405
Issue number	1
DOIs	https://doi.org/10.1080/00150193.2010.483377
Publication status	Published - 2010
MoE publication type	A1 Journal article-refereed

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10.1080/00150193.2010.483377

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title = "Orientation Dependent Dielectric Characteristics of Nanocrystalline Pb(ZrxTi1-x)O3 Films with Inter Digital Electrodes",

abstract = "Crystal structure and dielectric properties of nanocrystalline Pb(ZrxTi1-x)O3 films were studied. Intensity of Raman mode E(1LO) was increased and peak around ∼580 cm−1 became symmetric and strong (110) crystal plane reflection was observed as the thickness of the films increased from 150 nm to 500 nm. Curie-temperature was found to decrease from ∼370°C to ∼345°C as the orientation changed from tetragonal to trigonal. Dielectric constant was found to be maximized and loss angle minimized for single phase oriented films, while phase co-existence was found to increase loss angle values, and bimodal dielectric maxima were found.",

author = "J. Puustinen and J. Lappalainen and Jussi Hiltunen and V. Lantto and H. Jantunen",

year = "2010",

doi = "10.1080/00150193.2010.483377",

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T1 - Orientation Dependent Dielectric Characteristics of Nanocrystalline Pb(ZrxTi1-x)O3 Films with Inter Digital Electrodes

AU - Puustinen, J.

AU - Lappalainen, J.

AU - Hiltunen, Jussi

AU - Lantto, V.

AU - Jantunen, H.

PY - 2010

Y1 - 2010

N2 - Crystal structure and dielectric properties of nanocrystalline Pb(ZrxTi1-x)O3 films were studied. Intensity of Raman mode E(1LO) was increased and peak around ∼580 cm−1 became symmetric and strong (110) crystal plane reflection was observed as the thickness of the films increased from 150 nm to 500 nm. Curie-temperature was found to decrease from ∼370°C to ∼345°C as the orientation changed from tetragonal to trigonal. Dielectric constant was found to be maximized and loss angle minimized for single phase oriented films, while phase co-existence was found to increase loss angle values, and bimodal dielectric maxima were found.

AB - Crystal structure and dielectric properties of nanocrystalline Pb(ZrxTi1-x)O3 films were studied. Intensity of Raman mode E(1LO) was increased and peak around ∼580 cm−1 became symmetric and strong (110) crystal plane reflection was observed as the thickness of the films increased from 150 nm to 500 nm. Curie-temperature was found to decrease from ∼370°C to ∼345°C as the orientation changed from tetragonal to trigonal. Dielectric constant was found to be maximized and loss angle minimized for single phase oriented films, while phase co-existence was found to increase loss angle values, and bimodal dielectric maxima were found.

U2 - 10.1080/00150193.2010.483377

DO - 10.1080/00150193.2010.483377

M3 - Article

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VL - 405

SP - 227

EP - 235

JO - Ferroelectrics

JF - Ferroelectrics

IS - 1

ER -

Orientation Dependent Dielectric Characteristics of Nanocrystalline Pb(ZrxTi1-x)O3 Films with Inter Digital Electrodes

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Orientation Dependent Dielectric Characteristics of Nanocrystalline Pb(Zr_xTi_1-x)O₃Films with Inter Digital Electrodes