Orientation Gradients in Rapidly Solidified Pure Aluminum Thin Films: Comparison of Experiments and Phase-Field Crystal Simulations

Paul Jreidini, Tatu Pinomaa, Jörg M.K. Wiezorek, Joseph T. McKeown, Anssi Laukkanen, Nikolas Provatas

Research output: Contribution to journalArticleScientificpeer-review

1 Citation (Scopus)

Abstract

Rapid solidification experiments on thin film aluminum samples reveal the presence of lattice orientation gradients within crystallizing grains. To study this phenomenon, a single-component phase-field crystal (PFC) model that captures the properties of solid, liquid, and vapor phases is proposed to model pure aluminium quantitatively. A coarse-grained amplitude representation of this model is used to simulate solidification in samples approaching micrometer scales. The simulations reproduce the experimentally observed orientation gradients within crystallizing grains when grown at experimentally relevant rapid quenches. We propose a causal connection between defect formation and orientation gradients.
Original languageEnglish
Article number205701
Number of pages6
JournalPhysical Review Letters
Volume127
Issue number20
Early online date10 Nov 2021
DOIs
Publication statusPublished - 12 Nov 2021
MoE publication typeA1 Journal article-refereed

Keywords

  • crystal defects
  • crystal orienttation
  • liquid-solid phase transition
  • microstructure
  • polycrystalline materials
  • phase-field modeling
  • scanning transmission electron microscopy
  • solidification

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