| Original language | English |
|---|---|
| Publisher | International Academy, Research, and Industry Association IARIA |
| Number of pages | 91 |
| ISBN (Print) | 978-1-61208-111-3 |
| Publication status | Published - 2010 |
| MoE publication type | C2 Edited books |
PATTERNS 2010: The Second International Conference on Pervasive Patterns and Applications. November 21-26, 2010 - Lisbon, Portugal
Ali Beklen (Editor), Jorge Ejarque (Editor), Wolfgang Gentzsch (Editor), Teemu Kanstren (Editor), Arne Koschel (Editor), Yong Woo Lee (Editor), Li Li (Editor), Michal Zemlicka (Editor)
Research output: Book/Report › Book (editor) › Scientific › peer-review