PATTERNS 2010: The Second International Conference on Pervasive Patterns and Applications. November 21-26, 2010 - Lisbon, Portugal

Ali Beklen; Jorge Ejarque; Wolfgang Gentzsch; Teemu Kanstren; Arne Koschel; Yong Woo Lee; Li Li; Michal Zemlicka

PATTERNS 2010: The Second International Conference on Pervasive Patterns and Applications. November 21-26, 2010 - Lisbon, Portugal

Ali Beklen (Editor)
, Jorge Ejarque (Editor)
, Wolfgang Gentzsch (Editor)
, Teemu Kanstren (Editor)
, Arne Koschel (Editor)
, Yong Woo Lee (Editor)
, Li Li (Editor)
, Michal Zemlicka (Editor)

VTT Technical Research Centre of Finland

Research output: Book/Report › Book (editor) › Scientific › peer-review

Original language	English
Publisher	International Academy, Research, and Industry Association IARIA
Number of pages	91
ISBN (Print)	978-1-61208-111-3
Publication status	Published - 2010
MoE publication type	C2 Edited books

Access to Document

http://www.thinkmind.org/download_full.php?instance=PATTERNS+2010

Cite this

Beklen, A., Ejarque, J., Gentzsch, W., Kanstren, T., Koschel, A., Lee, Y. W., Li, L., & Zemlicka, M. (Eds.) (2010). PATTERNS 2010: The Second International Conference on Pervasive Patterns and Applications. November 21-26, 2010 - Lisbon, Portugal. International Academy, Research, and Industry Association IARIA. http://www.thinkmind.org/download_full.php?instance=PATTERNS+2010

@book{63e11bd6f4d1435cac03f3bc69447074,

title = "PATTERNS 2010: The Second International Conference on Pervasive Patterns and Applications. November 21-26, 2010 - Lisbon, Portugal",

editor = "Ali Beklen and Jorge Ejarque and Wolfgang Gentzsch and Teemu Kanstren and Arne Koschel and Lee, \{Yong Woo\} and Li Li and Michal Zemlicka",

year = "2010",

language = "English",

isbn = "978-1-61208-111-3",

publisher = "International Academy, Research, and Industry Association IARIA",

address = "United States",

}

TY - BOOK

T1 - PATTERNS 2010

T2 - The Second International Conference on Pervasive Patterns and Applications. November 21-26, 2010 - Lisbon, Portugal

A2 - Beklen, Ali

A2 - Ejarque, Jorge

A2 - Gentzsch, Wolfgang

A2 - Kanstren, Teemu

A2 - Koschel, Arne

A2 - Lee, Yong Woo

A2 - Li, Li

A2 - Zemlicka, Michal

PY - 2010

Y1 - 2010

M3 - Book (editor)

SN - 978-1-61208-111-3

BT - PATTERNS 2010

PB - International Academy, Research, and Industry Association IARIA

ER -