Peak current failure levels in ESD sensitive semiconductor devices and their application in evaluation of materials used in ESD protection: Part 2. Experimental verification

Physics

• Semiconductor Device 100%
• Evaluation 100%
• Yield Point 50%
• Environment 50%
• Protection 50%
• Utilization 50%
• Pulses 50%
• Area 50%
• Estimates 50%
• Boundaries 50%
• Failure 50%

Engineering

• Evaluation 100%
• Laboratories 50%
• Model Test 50%
• Environment 50%
• Assembly 50%
• Applications 50%
• Energy Engineering 50%
• Failure (Mechanical) 50%
• Current Threshold 50%
• Damage Threshold 50%
• Human Body Model 50%

Material Science

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• Electronics 100%
• Paper 50%
• Devices 50%