Pendellösung fringes in synchrotron X-ray topographs of a wedge-shaped silicon crystal

T. Tuomi, M. Tilli, Väinö Kelhä, J. Stephenson

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)


Pendellösung fringes in a silicon wedge crystal are observed in Laue transmission topographs taken with white synchrotron radiation. Fringe patterns in two spots are analyzed in detail with the aid of densitometer traces using dynamical theory of X‐ray diffraction. The nn̄n spot is shown to be a sum of the 111, 333, and 444 pendellösung fringe sets whereas the n̄3nn̄ spot has only one set of fringes due to 131 reflection. The fading of the 111 set with increasing thickness is determined by the anomalous absorption of the branch 2 wave‐field polarized parallel to the plane of incidence.

Original languageEnglish
Pages (from-to)427 - 431
Number of pages5
JournalPhysica Status Solidi A: Applied Research
Issue number2
Publication statusPublished - 1978
MoE publication typeNot Eligible


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