Pendellösung fringes in synchrotron X-ray topographs of a wedge-shaped silicon crystal

T. Tuomi, M. Tilli, Väinö Kelhä, J. Stephenson

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)

Abstract

Pendellösung fringes in a silicon wedge crystal are observed in Laue transmission topographs taken with white synchrotron radiation. Fringe patterns in two spots are analyzed in detail with the aid of densitometer traces using dynamical theory of X‐ray diffraction. The nn̄n spot is shown to be a sum of the 111, 333, and 444 pendellösung fringe sets whereas the n̄3nn̄ spot has only one set of fringes due to 131 reflection. The fading of the 111 set with increasing thickness is determined by the anomalous absorption of the branch 2 wave‐field polarized parallel to the plane of incidence.

Original languageEnglish
Pages (from-to)427 - 431
Number of pages5
JournalPhysica Status Solidi A: Applied Research
Volume50
Issue number2
DOIs
Publication statusPublished - 1978
MoE publication typeNot Eligible

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densitometers
Densitometers
Silicon
fading
Synchrotron radiation
Synchrotrons
wedges
synchrotron radiation
synchrotrons
diffraction patterns
incidence
Diffraction
X rays
Crystals
silicon
diffraction
crystals
x rays

Cite this

Tuomi, T. ; Tilli, M. ; Kelhä, Väinö ; Stephenson, J. / Pendellösung fringes in synchrotron X-ray topographs of a wedge-shaped silicon crystal. In: Physica Status Solidi A: Applied Research. 1978 ; Vol. 50, No. 2. pp. 427 - 431.
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abstract = "Pendell{\"o}sung fringes in a silicon wedge crystal are observed in Laue transmission topographs taken with white synchrotron radiation. Fringe patterns in two spots are analyzed in detail with the aid of densitometer traces using dynamical theory of X‐ray diffraction. The nn̄n spot is shown to be a sum of the 111, 333, and 444 pendell{\"o}sung fringe sets whereas the n̄3nn̄ spot has only one set of fringes due to 131 reflection. The fading of the 111 set with increasing thickness is determined by the anomalous absorption of the branch 2 wave‐field polarized parallel to the plane of incidence.",
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Pendellösung fringes in synchrotron X-ray topographs of a wedge-shaped silicon crystal. / Tuomi, T.; Tilli, M.; Kelhä, Väinö; Stephenson, J.

In: Physica Status Solidi A: Applied Research, Vol. 50, No. 2, 1978, p. 427 - 431.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Pendellösung fringes in synchrotron X-ray topographs of a wedge-shaped silicon crystal

AU - Tuomi, T.

AU - Tilli, M.

AU - Kelhä, Väinö

AU - Stephenson, J.

PY - 1978

Y1 - 1978

N2 - Pendellösung fringes in a silicon wedge crystal are observed in Laue transmission topographs taken with white synchrotron radiation. Fringe patterns in two spots are analyzed in detail with the aid of densitometer traces using dynamical theory of X‐ray diffraction. The nn̄n spot is shown to be a sum of the 111, 333, and 444 pendellösung fringe sets whereas the n̄3nn̄ spot has only one set of fringes due to 131 reflection. The fading of the 111 set with increasing thickness is determined by the anomalous absorption of the branch 2 wave‐field polarized parallel to the plane of incidence.

AB - Pendellösung fringes in a silicon wedge crystal are observed in Laue transmission topographs taken with white synchrotron radiation. Fringe patterns in two spots are analyzed in detail with the aid of densitometer traces using dynamical theory of X‐ray diffraction. The nn̄n spot is shown to be a sum of the 111, 333, and 444 pendellösung fringe sets whereas the n̄3nn̄ spot has only one set of fringes due to 131 reflection. The fading of the 111 set with increasing thickness is determined by the anomalous absorption of the branch 2 wave‐field polarized parallel to the plane of incidence.

U2 - 10.1002/pssa.2210500209

DO - 10.1002/pssa.2210500209

M3 - Article

VL - 50

SP - 427

EP - 431

JO - Physica Status Solidi A: Applications and Materials Science

JF - Physica Status Solidi A: Applications and Materials Science

SN - 1862-6300

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ER -