Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)

Xiaoqi Yue, Per Malmberg, Elisa Isotahdon, Vilma Ratia-Hanby, Elina Huttunen-Saarivirta, Christofer Leygraf, Jinshan Pan (Corresponding Author)

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Chemistry