Skip to main navigation Skip to search Skip to main content

Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)

    • KTH Royal Institute of Technology
    • Chalmers University of Technology

    Research output: Contribution to journal › Article › Scientific › peer-review

    Filter
    Article

    Search results