Performance of nanoparticles in the electrical behavior of DC capacitor films

Gian Carlo Montanari, Paolo Seri, Mikael Ritamaki, Kari Lahti, Ilkka Rytoluoto, Mika Paajanen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

8 Citations (Scopus)

Abstract

In this work space charge accumulation characteristics of nanostructured polypropylene films are investigated, providing preliminary results for the basis of the new materials formulations to be developed in the European project GRIDABLE, where novel MV and LV DC capacitor films having enhanced performance with respect to present polypropylene films are being developed. This paper shows that nanostructuration may be beneficial, especially at higher temperature, to improve material performance. Better space charge performance will help in optimizing the dielectric strength, design field and reliability of the insulation system for DC use.

Original languageEnglish
Title of host publicationICPADM 2018 - 12th International Conference on the Properties and Applications of Dielectric Materials
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages41-44
Number of pages4
ISBN (Electronic)978-1-5386-5788-1, 978-1-5386-5786-7 , 978-1-5386-5787-4
ISBN (Print)978-1-5386-5789-8
DOIs
Publication statusPublished - 29 Jun 2018
MoE publication typeNot Eligible
Event12th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2018 - Xi'an, China
Duration: 20 May 201824 May 2018

Conference

Conference12th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2018
CountryChina
CityXi'an
Period20/05/1824/05/18

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  • Cite this

    Montanari, G. C., Seri, P., Ritamaki, M., Lahti, K., Rytoluoto, I., & Paajanen, M. (2018). Performance of nanoparticles in the electrical behavior of DC capacitor films. In ICPADM 2018 - 12th International Conference on the Properties and Applications of Dielectric Materials (pp. 41-44). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/ICPADM.2018.8401024