Abstract
A binary alloy multi-order parameter phase field model is used to study rapid solidification in Al-Cu under conditions corresponding to recent dynamic transmission electron microscopy (DTEM) experiments. The phase field model's sharp interface limit is set through a recent matched asymptotic analysis to follow the solute trapping and interface undercooling kinetics of the Continuous Growth Model (CGM). The phase field model convergence to the CGM sharp interface model is investigated, and based on this an optimal interface width is chosen to simulate the DTEM experimental conditions. The temperature distribution used in the phase field simulations is taken from an analytic expression extracted from experiments. Simulated solidification structures are compared to experiments, including time-resolved DTEM images and post-mortem TEM-based image quality and orientation maps. We find that the large scale morphological features of the simulated microstructures are in good agreement with the experiments, and the corresponding concentration profiles that emerge are in qualitative agreement with experiments. These results show that phase field simulations, informed with DTEM experiments, provides a promising framework to investigate rapidly solidified microstructure evolution and solute segregation, and to calibrate hard-to-determine solidification parameters.
| Original language | English |
|---|---|
| Article number | 125418 |
| Journal | Journal of Crystal Growth |
| Volume | 532 |
| DOIs | |
| Publication status | Published - 15 Feb 2020 |
| MoE publication type | A1 Journal article-refereed |
Fingerprint
Keywords
- A1. Characterization
- A1. Computer simulation
- A1. Crystal morphology
- A1. Segregation
- B1. Alloys
Cite this
}
Phase field modeling of rapid resolidification of Al-Cu thin films. / Pinomaa, Tatu (Corresponding Author); McKeown, Joseph; Wiezorek, Jörg; Provatas, Nikolas; Laukkanen, Anssi; Suhonen, Tomi.
In: Journal of Crystal Growth, Vol. 532, 125418, 15.02.2020.Research output: Contribution to journal › Article › Scientific › peer-review
TY - JOUR
T1 - Phase field modeling of rapid resolidification of Al-Cu thin films
AU - Pinomaa, Tatu
AU - McKeown, Joseph
AU - Wiezorek, Jörg
AU - Provatas, Nikolas
AU - Laukkanen, Anssi
AU - Suhonen, Tomi
PY - 2020/2/15
Y1 - 2020/2/15
N2 - A binary alloy multi-order parameter phase field model is used to study rapid solidification in Al-Cu under conditions corresponding to recent dynamic transmission electron microscopy (DTEM) experiments. The phase field model's sharp interface limit is set through a recent matched asymptotic analysis to follow the solute trapping and interface undercooling kinetics of the Continuous Growth Model (CGM). The phase field model convergence to the CGM sharp interface model is investigated, and based on this an optimal interface width is chosen to simulate the DTEM experimental conditions. The temperature distribution used in the phase field simulations is taken from an analytic expression extracted from experiments. Simulated solidification structures are compared to experiments, including time-resolved DTEM images and post-mortem TEM-based image quality and orientation maps. We find that the large scale morphological features of the simulated microstructures are in good agreement with the experiments, and the corresponding concentration profiles that emerge are in qualitative agreement with experiments. These results show that phase field simulations, informed with DTEM experiments, provides a promising framework to investigate rapidly solidified microstructure evolution and solute segregation, and to calibrate hard-to-determine solidification parameters.
AB - A binary alloy multi-order parameter phase field model is used to study rapid solidification in Al-Cu under conditions corresponding to recent dynamic transmission electron microscopy (DTEM) experiments. The phase field model's sharp interface limit is set through a recent matched asymptotic analysis to follow the solute trapping and interface undercooling kinetics of the Continuous Growth Model (CGM). The phase field model convergence to the CGM sharp interface model is investigated, and based on this an optimal interface width is chosen to simulate the DTEM experimental conditions. The temperature distribution used in the phase field simulations is taken from an analytic expression extracted from experiments. Simulated solidification structures are compared to experiments, including time-resolved DTEM images and post-mortem TEM-based image quality and orientation maps. We find that the large scale morphological features of the simulated microstructures are in good agreement with the experiments, and the corresponding concentration profiles that emerge are in qualitative agreement with experiments. These results show that phase field simulations, informed with DTEM experiments, provides a promising framework to investigate rapidly solidified microstructure evolution and solute segregation, and to calibrate hard-to-determine solidification parameters.
KW - A1. Characterization
KW - A1. Computer simulation
KW - A1. Crystal morphology
KW - A1. Segregation
KW - B1. Alloys
UR - http://www.scopus.com/inward/record.url?scp=85076682342&partnerID=8YFLogxK
U2 - 10.1016/j.jcrysgro.2019.125418
DO - 10.1016/j.jcrysgro.2019.125418
M3 - Article
VL - 532
JO - Journal of Crystal Growth
JF - Journal of Crystal Growth
SN - 0022-0248
M1 - 125418
ER -