Abstract
Phase noise in capacitively coupled micro-resonator-based oscillators is
investigated. A detailed analysis of noise mixing mechanisms in the
resonator is presented, and the capacitive transduction is shown to be
the dominant mechanism for low-frequency 1/f-noise mixing into the
carrier sidebands. Thus, the capacitively coupled micromechanical
resonators are expected to be more prone to the 1/f-noise aliasing than
piezoelectrically coupled resonators. The analytical work is
complemented with simulations, and a highly efficient and accurate
simulation method for a quantitative noise analysis in closed-loop
oscillator applications is presented. Measured phase noise for a
microresonator-based oscillator is found to agree with the developed
analytical and simulated noise models.
Original language | English |
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Pages (from-to) | 2322 - 2331 |
Number of pages | 10 |
Journal | IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control |
Volume | 52 |
Issue number | 12 |
DOIs | |
Publication status | Published - 2005 |
MoE publication type | A1 Journal article-refereed |