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Pixelized M-p-n CdTe detector coupled to Medipix2 readout chip
Juha Kalliopuska
, S. Nenonen
, Raimo Penttilä
,
Harri Pohjonen
, L. Tlustos
, Akiko Gädda
,
Jari Likonen
, H. Andersson
, Petri Laakso
, Ilkka Vanttaja
Oxford Instruments Analytical Oy
European Organization for Nuclear Research (CERN)
Research output
:
Contribution to journal
›
Article
›
Scientific
›
peer-review
2
Citations (Scopus)
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Keyphrases
Diode
100%
CdTe Detector
100%
Readout chip
100%
Medipix2
100%
Diamond Blade
75%
Indium
50%
Anode Side
50%
P-n Junction
50%
CdTe Diodes
50%
Pixelization
50%
Secondary Ion Mass Spectrometry
25%
Thermal Load
25%
Pulsed Laser
25%
P-type
25%
Microstrip
25%
Flip chip
25%
Semiconductor Materials
25%
Leakage Current
25%
Imaging Results
25%
Double-sided
25%
Cadmium Telluride
25%
Bonding Process
25%
Edgeless Detector
25%
Femtosecond Laser
25%
X-ray Sources
25%
Picosecond
25%
Inter-strip Resistance
25%
Polarization Effect
25%
Laser Process
25%
Detector Configurations
25%
Junction Depth
25%
Flip-chip Bonding
25%
INIS
anodes
100%
readout systems
100%
cdte semiconductor detectors
100%
diamonds
60%
junctions
60%
cadmium tellurides
60%
lasers
40%
cathodes
40%
indium
40%
comparative evaluations
20%
bonding
20%
depth
20%
ions
20%
configuration
20%
precision
20%
semiconductor materials
20%
mass spectrometry
20%
polarization
20%
leakage current
20%
x-ray sources
20%
Engineering
Anode Side
100%
Diamond
100%
Cathode Side
66%
Pn Junction
66%
Chip Bonding
33%
Anodes and Cathode
33%
Bonding Process
33%
Picosecond
33%
Polarization Effect
33%
Junction Depth
33%
Ray Source
33%
Thermal Load
33%
Pulsed Laser
33%
Material Science
Anode
100%
Diamond
60%
Cathode
40%
Indium
40%
Semiconductor Material
20%
Secondary Ion Mass Spectrometry
20%
Thermal Loads
20%
Physics
Indium
100%
Pulsed Laser
50%
X Ray Source
50%
Semiconductor (Material)
50%
Secondary Ion Mass Spectrometry
50%