Skip to main navigation
Skip to search
Skip to main content
VTT's Research Information Portal Home
Search content at VTT's Research Information Portal
Home
Profiles
Research output
Projects
Datasets
Research units
Research Infrastructures
Activities
Prizes
Press/Media
Impacts
Pixelized M-p-n CdTe detector coupled to Medipix2 readout chip
Juha Kalliopuska
, S. Nenonen
, Raimo Penttilä
,
Harri Pohjonen
, L. Tlustos
, Akiko Gädda
,
Jari Likonen
, H. Andersson
, Petri Laakso
, Ilkka Vanttaja
Oxford Instruments Analytical Oy
European Organization for Nuclear Research (CERN)
Research output
:
Contribution to journal
›
Article
›
Scientific
›
peer-review
2
Link opens in a new tab
Citations (Scopus)
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Pixelized M-p-n CdTe detector coupled to Medipix2 readout chip'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Diode
100%
Cadmium Telluride
100%
CdTe Detector
100%
Medipix
100%
Readout chip
100%
Diamond Blade
75%
Indium
50%
Anode Side
50%
P-n Junction
50%
CdTe Diodes
50%
Pixelization
50%
Flip-chip Bonding
50%
Secondary Ion Mass Spectrometry
25%
Thermal Load
25%
Pulsed Laser
25%
Microstrip
25%
Semiconductor Materials
25%
Leakage Current
25%
Imaging Results
25%
Double-sided
25%
Bonding Process
25%
Edgeless Detector
25%
Femtosecond Laser
25%
X-ray Sources
25%
Picosecond
25%
Inter-strip Resistance
25%
Polarization Effect
25%
Laser Process
25%
Detector Configurations
25%
Junction Depth
25%
Engineering
Anode Side
100%
Diamond
100%
Cathode Side
66%
Pn Junction
66%
Chip Bonding
33%
Anodes and Cathode
33%
Bonding Process
33%
Picosecond
33%
Polarization Effect
33%
Junction Depth
33%
Ray Source
33%
Thermal Load
33%
Pulsed Laser
33%
Mass Spectrum
33%
Mass Spectrometry
33%
Semiconductor Material
33%
X Ray
33%
Mass Spectroscopy
33%
microstrip
33%
INIS
anodes
100%
readout systems
100%
cdte semiconductor detectors
100%
diamonds
60%
junctions
60%
cadmium tellurides
60%
lasers
40%
cathodes
40%
indium
40%
comparative evaluations
20%
bonding
20%
depth
20%
ions
20%
configuration
20%
precision
20%
semiconductor materials
20%
mass spectrometry
20%
polarization
20%
leakage current
20%
x-ray sources
20%
Material Science
Anode
100%
Diamond
60%
Cathode
40%
Indium
40%
Semiconductor Material
20%
Secondary Ion Mass Spectrometry
20%
Thermal Loads
20%
Physics
Polarization Effect
25%