PLM Impact Analysis Model: PIA

Simo-Pekka Leino, Juha-Pekka Anttila, Juhamatti Heikkilä, Joonas Aaltonen, Kaj Helin

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    1 Citation (Scopus)


    Our goal was to create a support for better PLM development target identification. A method titled ”PIA – PLM Impact Analysis” was created in order to help recognizing the most value-adding potentials. The method is supported by a MS–Excel based tool. The method was built and developed in workshops interactively with researchers and representatives from companies. So far the PIA method and tool has been tested in two large industrial companies from heavy machinery segments. Results from testing the PIA tool are encouraging. The most remarkable benefits of the tool are achieved by improved communication and discussion between departments and functions, and the systematic way of gathering and analysing data. In the future work usability of the tool will be extended. The gathered data will be analysed and synthesized in order to build better generic future PLM models.
    Original languageEnglish
    Title of host publicationProduct Lifecycle Management
    Subtitle of host publicationTowards Knowledge-Rich Enterprises
    ISBN (Electronic)978-3-642-35758-9
    ISBN (Print)978-3-642-35757-2
    Publication statusPublished - 2012
    MoE publication typeA4 Article in a conference publication
    Event9th IFIP WG 5.1 International Conference on Product Lifecycle Management, PLM 2012 - Montreal, Canada
    Duration: 9 Jul 201211 Jul 2012

    Publication series

    SeriesIFIP Advances in Information and Communication Technology


    Conference9th IFIP WG 5.1 International Conference on Product Lifecycle Management, PLM 2012


    • PLM
    • impact
    • analysis
    • benefit
    • defect
    • potential


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