PLM Impact Analysis Model - PIA

  • Simo-Pekka Leino
  • , Juha-Pekka Anttila
  • , Juhamatti Heikkilä
  • , Joonas Aaltonen
  • , Kaj Helin

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

Our goal was to create a support for better PLM development target identification. A method titled ”PIA – PLM Impact Analysis” was created in order to help recognizing the most value-adding potentials. The method is supported by a MS–Excel based tool. The method was built and developed in workshops interactively with researchers and representatives from companies. So far the PIA method and tool has been tested in two large industrial companies from heavy machinery segments. Results from testing the PIA tool are encouraging. The most remarkable benefits of the tool are achieved by improved communication and discussion between departments and functions, and the systematic way of gathering and analysing data. In the future work usability of the tool will be extended. The gathered data will be analysed and synthesized in order to build better generic future PLM models.
Original languageEnglish
Title of host publicationProduct Lifecycle Management
Subtitle of host publicationTowards Knowledge-Rich Enterprises
PublisherSpringer
Pages501-511
ISBN (Electronic)978-3-642-35758-9
ISBN (Print)978-3-642-35757-2
DOIs
Publication statusPublished - 2012
MoE publication typeA4 Article in a conference publication
Event9th IFIP WG 5.1 International Conference on Product Lifecycle Management, PLM 2012 - Montreal, Canada
Duration: 9 Jul 201211 Jul 2012

Publication series

SeriesIFIP Advances in Information and Communication Technology
Volume388
ISSN1868-4238

Conference

Conference9th IFIP WG 5.1 International Conference on Product Lifecycle Management, PLM 2012
Country/TerritoryCanada
CityMontreal
Period9/07/1211/07/12

Keywords

  • PLM
  • impact
  • analysis
  • benefit
  • defect
  • potential

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