Polarization splitters for micron-scale silicon photonics

Dura Shahwar* (Corresponding author), Matteo Cherchi, Mikko Harjanne, Markku Kapulainen, Timo Aalto

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

4 Citations (Scopus)

Abstract

We present polarization splitters for micron-scale silicon photonics based on Mach-Zehnder interferometers (MZI). We have designed the polarization splitters based on an advanced transfer matrix model, then confirmed by numerical simulations. We have fabricated the devices on our 3 µm-thick silicon on insulator (SOI) platform and successfully measured polarization splitting over a wide wavelength range (1450-1650 nm). We have achieved an extinction ratio (ER) >14dB for both polarizations on a bandwidth of 35 nm. However, high ER upto 20 dB is observed when considering one polarization.

Original languageEnglish
Title of host publicationSilicon Photonics XVI
EditorsGraham T. Reed, Andrew P. Knights
PublisherInternational Society for Optics and Photonics SPIE
ISBN (Print)978-1-5106-4217-1
DOIs
Publication statusPublished - 2021
MoE publication typeA4 Article in a conference publication
EventSilicon Photonics XVI 2021 - Virtual, Online, United States
Duration: 6 Mar 202111 Mar 2021

Publication series

SeriesProceedings of SPIE - The International Society for Optical Engineering
Volume11691
ISSN0277-786X

Conference

ConferenceSilicon Photonics XVI 2021
Country/TerritoryUnited States
CityVirtual, Online
Period6/03/2111/03/21

Keywords

  • form-birefringence
  • Polarization
  • polarization splitter
  • Silicon photonics
  • stress birefringence

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