Practical experiences on QC measurements of custom IC's

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

    Original languageEnglish
    Title of host publication12th Nordic Semiconductor Meeting
    Place of PublicationOslo
    Publication statusPublished - 1986
    MoE publication typeB3 Non-refereed article in conference proceedings
    Event12th Nordic Semiconductor Meeting - Jevnaker, Norway
    Duration: 8 Jun 198611 Jun 1986
    Conference number: 12

    Conference

    Conference12th Nordic Semiconductor Meeting
    CountryNorway
    CityJevnaker
    Period8/06/8611/06/86

    Cite this

    Salonen, J. (1986). Practical experiences on QC measurements of custom IC's. In 12th Nordic Semiconductor Meeting