Abstract
Methods are presented to improve measurement accuracy in on-wafer measurements of active devices at millimeter wave frequencies. The scope of the paper is in on-wafer measurements but the methods presented here, can also be used in coaxial or waveguide based measurements of active devices.
Original language | English |
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Title of host publication | Proceedings of the International Joint Conference of the 6th Topical Symposium on Millimeter Waves (TSMMW2004) and the 5th MINT Millimeter-Wave International Symposium (MINT-MIS) |
Publisher | Communications Research Laboratory |
Pages | 118-121 |
Publication status | Published - 2004 |
MoE publication type | Not Eligible |
Event | International Joint Conference of the 6th Topical Symposium on Millimeter Waves, TSMMW 2004 and the 5th MINT Millimeter-Wave International Symposium, MINT-MIS 2004. - Yokosuka, Japan Duration: 26 Feb 2004 → 27 Feb 2004 |
Conference
Conference | International Joint Conference of the 6th Topical Symposium on Millimeter Waves, TSMMW 2004 and the 5th MINT Millimeter-Wave International Symposium, MINT-MIS 2004. |
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Country/Territory | Japan |
City | Yokosuka |
Period | 26/02/04 → 27/02/04 |
Keywords
- noise figure
- on-wafer measurements
- LNA
- HEMT