Precision spectroscopy of acetylene transitions using an optical frequency synthesizer

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13 Citations (Scopus)

Abstract

An optical frequency synthesizer is used for saturation spectroscopy of acetylene near 1540 nm. In the synthesizer, a user-specified frequency is generated from an atomic time base by phase locking the second harmonic of a cw near-IR external-cavity diode laser (ECDL) to a Ti:sapphire frequency comb. By stepping the repetition rate of the frequency comb, the ECDL frequency is swept over an acetylene transition in a saturated absorption spectroscopy setup. Hence, a spectral lineshape is measured with an absolute frequency scale. Line-center frequencies determined by fitting theoretical line profiles to the measured data are in good agreement with values measured with the ECDL stabilized to acetylene by third-harmonic locking and with the values recommended by the International Committee for Weights and Measures (CIPM).
Original languageEnglish
Pages (from-to)2619-2621
Number of pages3
JournalOptics Letters
Volume34
Issue number17
DOIs
Publication statusPublished - 2009
MoE publication typeA1 Journal article-refereed

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frequency synthesizers
acetylene
spectroscopy
semiconductor lasers
cavities
locking
harmonics
synthesizers
sweep frequency
repetition
absorption spectroscopy
sapphire
saturation
profiles

Cite this

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title = "Precision spectroscopy of acetylene transitions using an optical frequency synthesizer",
abstract = "An optical frequency synthesizer is used for saturation spectroscopy of acetylene near 1540 nm. In the synthesizer, a user-specified frequency is generated from an atomic time base by phase locking the second harmonic of a cw near-IR external-cavity diode laser (ECDL) to a Ti:sapphire frequency comb. By stepping the repetition rate of the frequency comb, the ECDL frequency is swept over an acetylene transition in a saturated absorption spectroscopy setup. Hence, a spectral lineshape is measured with an absolute frequency scale. Line-center frequencies determined by fitting theoretical line profiles to the measured data are in good agreement with values measured with the ECDL stabilized to acetylene by third-harmonic locking and with the values recommended by the International Committee for Weights and Measures (CIPM).",
author = "V. Ahtee and M. Merimaa and K. Nyholm",
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language = "English",
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Precision spectroscopy of acetylene transitions using an optical frequency synthesizer. / Ahtee, V.; Merimaa, M.; Nyholm, K.

In: Optics Letters, Vol. 34, No. 17, 2009, p. 2619-2621.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Precision spectroscopy of acetylene transitions using an optical frequency synthesizer

AU - Ahtee, V.

AU - Merimaa, M.

AU - Nyholm, K.

PY - 2009

Y1 - 2009

N2 - An optical frequency synthesizer is used for saturation spectroscopy of acetylene near 1540 nm. In the synthesizer, a user-specified frequency is generated from an atomic time base by phase locking the second harmonic of a cw near-IR external-cavity diode laser (ECDL) to a Ti:sapphire frequency comb. By stepping the repetition rate of the frequency comb, the ECDL frequency is swept over an acetylene transition in a saturated absorption spectroscopy setup. Hence, a spectral lineshape is measured with an absolute frequency scale. Line-center frequencies determined by fitting theoretical line profiles to the measured data are in good agreement with values measured with the ECDL stabilized to acetylene by third-harmonic locking and with the values recommended by the International Committee for Weights and Measures (CIPM).

AB - An optical frequency synthesizer is used for saturation spectroscopy of acetylene near 1540 nm. In the synthesizer, a user-specified frequency is generated from an atomic time base by phase locking the second harmonic of a cw near-IR external-cavity diode laser (ECDL) to a Ti:sapphire frequency comb. By stepping the repetition rate of the frequency comb, the ECDL frequency is swept over an acetylene transition in a saturated absorption spectroscopy setup. Hence, a spectral lineshape is measured with an absolute frequency scale. Line-center frequencies determined by fitting theoretical line profiles to the measured data are in good agreement with values measured with the ECDL stabilized to acetylene by third-harmonic locking and with the values recommended by the International Committee for Weights and Measures (CIPM).

U2 - 10.1364/OL.34.002619

DO - 10.1364/OL.34.002619

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EP - 2621

JO - Optics Letters

JF - Optics Letters

SN - 0146-9592

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