Preface

A. Alimohammad, A. Baruzzo, L. Du Bousquet, P. Dini, H. Muccini, A. Klaus, Juho Perälä, D. Pandini, R. Senguttuvan, A. Sinha, A. Stefanescu, B. Vermeulen, S. Van Baelen, H.-G. Gross

Research output: Chapter in Book/Report/Conference proceedingOther book partScientific

Abstract

Presents the introductory welcome message from the conference proceedings. May include the conference officers' congratulations to all involved with the conference event and publication of the proceedings record.
Original languageEnglish
Title of host publicationProceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010
PublisherInstitute of Electrical and Electronic Engineers IEEE
Pagesviii-ix
ISBN (Print)978-0-7695-4146-4, 978-1-4244-7784-5
DOIs
Publication statusPublished - 2010
MoE publication typeB2 Part of a book or another research book
Event2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010 - Nice, France
Duration: 22 Aug 201027 Aug 2010
Conference number: 2

Conference

Conference2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010
Abbreviated titleVALID 2010
CountryFrance
CityNice
Period22/08/1027/08/10

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Alimohammad, A., Baruzzo, A., Du Bousquet, L., Dini, P., Muccini, H., Klaus, A., ... Gross, H-G. (2010). Preface. In Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010 (pp. viii-ix). Institute of Electrical and Electronic Engineers IEEE. https://doi.org/10.1109/VALID.2010.4
Alimohammad, A. ; Baruzzo, A. ; Du Bousquet, L. ; Dini, P. ; Muccini, H. ; Klaus, A. ; Perälä, Juho ; Pandini, D. ; Senguttuvan, R. ; Sinha, A. ; Stefanescu, A. ; Vermeulen, B. ; Van Baelen, S. ; Gross, H.-G. / Preface. Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010. Institute of Electrical and Electronic Engineers IEEE, 2010. pp. viii-ix
@inbook{60d380af2f954341a6ba8be670565788,
title = "Preface",
abstract = "Presents the introductory welcome message from the conference proceedings. May include the conference officers' congratulations to all involved with the conference event and publication of the proceedings record.",
author = "A. Alimohammad and A. Baruzzo and {Du Bousquet}, L. and P. Dini and H. Muccini and A. Klaus and Juho Per{\"a}l{\"a} and D. Pandini and R. Senguttuvan and A. Sinha and A. Stefanescu and B. Vermeulen and {Van Baelen}, S. and H.-G. Gross",
year = "2010",
doi = "10.1109/VALID.2010.4",
language = "English",
isbn = "978-0-7695-4146-4",
pages = "viii--ix",
booktitle = "Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010",
publisher = "Institute of Electrical and Electronic Engineers IEEE",
address = "United States",

}

Alimohammad, A, Baruzzo, A, Du Bousquet, L, Dini, P, Muccini, H, Klaus, A, Perälä, J, Pandini, D, Senguttuvan, R, Sinha, A, Stefanescu, A, Vermeulen, B, Van Baelen, S & Gross, H-G 2010, Preface. in Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010. Institute of Electrical and Electronic Engineers IEEE, pp. viii-ix, 2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010, Nice, France, 22/08/10. https://doi.org/10.1109/VALID.2010.4

Preface. / Alimohammad, A.; Baruzzo, A.; Du Bousquet, L.; Dini, P.; Muccini, H.; Klaus, A.; Perälä, Juho; Pandini, D.; Senguttuvan, R.; Sinha, A.; Stefanescu, A.; Vermeulen, B.; Van Baelen, S.; Gross, H.-G.

Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010. Institute of Electrical and Electronic Engineers IEEE, 2010. p. viii-ix.

Research output: Chapter in Book/Report/Conference proceedingOther book partScientific

TY - CHAP

T1 - Preface

AU - Alimohammad, A.

AU - Baruzzo, A.

AU - Du Bousquet, L.

AU - Dini, P.

AU - Muccini, H.

AU - Klaus, A.

AU - Perälä, Juho

AU - Pandini, D.

AU - Senguttuvan, R.

AU - Sinha, A.

AU - Stefanescu, A.

AU - Vermeulen, B.

AU - Van Baelen, S.

AU - Gross, H.-G.

PY - 2010

Y1 - 2010

N2 - Presents the introductory welcome message from the conference proceedings. May include the conference officers' congratulations to all involved with the conference event and publication of the proceedings record.

AB - Presents the introductory welcome message from the conference proceedings. May include the conference officers' congratulations to all involved with the conference event and publication of the proceedings record.

U2 - 10.1109/VALID.2010.4

DO - 10.1109/VALID.2010.4

M3 - Other book part

SN - 978-0-7695-4146-4

SN - 978-1-4244-7784-5

SP - viii-ix

BT - Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010

PB - Institute of Electrical and Electronic Engineers IEEE

ER -

Alimohammad A, Baruzzo A, Du Bousquet L, Dini P, Muccini H, Klaus A et al. Preface. In Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010. Institute of Electrical and Electronic Engineers IEEE. 2010. p. viii-ix https://doi.org/10.1109/VALID.2010.4