Preface

A. Alimohammad, A. Baruzzo, L. Du Bousquet, P. Dini, H. Muccini, A. Klaus, Juho Perälä, D. Pandini, R. Senguttuvan, A. Sinha, A. Stefanescu, B. Vermeulen, S. Van Baelen, H.-G. Gross

Research output: Chapter in Book/Report/Conference proceedingOther book partScientific

Abstract

Presents the introductory welcome message from the conference proceedings. May include the conference officers' congratulations to all involved with the conference event and publication of the proceedings record.
Original languageEnglish
Title of host publicationProceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010
PublisherIEEE Institute of Electrical and Electronic Engineers
Pagesviii-ix
ISBN (Print)978-0-7695-4146-4, 978-1-4244-7784-5
DOIs
Publication statusPublished - 2010
MoE publication typeB2 Part of a book or another research book
Event2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010 - Nice, France
Duration: 22 Aug 201027 Aug 2010
Conference number: 2

Conference

Conference2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010
Abbreviated titleVALID 2010
CountryFrance
CityNice
Period22/08/1027/08/10

Cite this

Alimohammad, A., Baruzzo, A., Du Bousquet, L., Dini, P., Muccini, H., Klaus, A., Perälä, J., Pandini, D., Senguttuvan, R., Sinha, A., Stefanescu, A., Vermeulen, B., Van Baelen, S., & Gross, H-G. (2010). Preface. In Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010 (pp. viii-ix). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/VALID.2010.4