Preface: Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010

A. Alimohammad; A. Baruzzo; L. Du Bousquet; P. Dini; H. Muccini; A. Klaus; Juho Perälä; D. Pandini; R. Senguttuvan; A. Sinha; A. Stefanescu; B. Vermeulen; S. Van Baelen; H.-G. Gross

doi:10.1109/VALID.2010.4

Preface: Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010

A. Alimohammad, A. Baruzzo, L. Du Bousquet, P. Dini, H. Muccini, A. Klaus, Juho Perälä, D. Pandini, R. Senguttuvan, A. Sinha, A. Stefanescu, B. Vermeulen, S. Van Baelen, H.-G. Gross

VTT Technical Research Centre of Finland

Research output: Chapter in Book/Report/Conference proceeding › Other book part › Scientific

Abstract

Presents the introductory welcome message from the conference proceedings. May include the conference officers' congratulations to all involved with the conference event and publication of the proceedings record.

Original language	English
Title of host publication	Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	viii-ix
ISBN (Print)	978-0-7695-4146-4, 978-1-4244-7784-5
DOIs	https://doi.org/10.1109/VALID.2010.4
Publication status	Published - 2010
MoE publication type	B2 Part of a book or another research book
Event	2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010 - Nice, France Duration: 22 Aug 2010 → 27 Aug 2010 Conference number: 2

Conference

Conference	2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010
Abbreviated title	VALID 2010
Country/Territory	France
City	Nice
Period	22/08/10 → 27/08/10

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10.1109/VALID.2010.4

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Alimohammad, A., Baruzzo, A., Du Bousquet, L., Dini, P., Muccini, H., Klaus, A., Perälä, J., Pandini, D., Senguttuvan, R., Sinha, A., Stefanescu, A., Vermeulen, B., Van Baelen, S., & Gross, H.-G. (2010). Preface: Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010. In Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010 (pp. viii-ix). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/VALID.2010.4

Alimohammad, A. ; Baruzzo, A. ; Du Bousquet, L. et al. / Preface : Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010. Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010. IEEE Institute of Electrical and Electronic Engineers, 2010. pp. viii-ix

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title = "Preface: Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010",

abstract = "Presents the introductory welcome message from the conference proceedings. May include the conference officers' congratulations to all involved with the conference event and publication of the proceedings record.",

author = "A. Alimohammad and A. Baruzzo and {Du Bousquet}, L. and P. Dini and H. Muccini and A. Klaus and Juho Per{\"a}l{\"a} and D. Pandini and R. Senguttuvan and A. Sinha and A. Stefanescu and B. Vermeulen and {Van Baelen}, S. and H.-G. Gross",

year = "2010",

doi = "10.1109/VALID.2010.4",

language = "English",

isbn = "978-0-7695-4146-4",

pages = "viii--ix",

booktitle = "Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

note = "2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010, VALID 2010 ; Conference date: 22-08-2010 Through 27-08-2010",

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Alimohammad, A, Baruzzo, A, Du Bousquet, L, Dini, P, Muccini, H, Klaus, A, Perälä, J, Pandini, D, Senguttuvan, R, Sinha, A, Stefanescu, A, Vermeulen, B, Van Baelen, S & Gross, H-G 2010, Preface: Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010. in Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010. IEEE Institute of Electrical and Electronic Engineers, pp. viii-ix, 2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010, Nice, France, 22/08/10. https://doi.org/10.1109/VALID.2010.4

Preface: Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010. / Alimohammad, A.; Baruzzo, A.; Du Bousquet, L. et al.
Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010. IEEE Institute of Electrical and Electronic Engineers, 2010. p. viii-ix.

Research output: Chapter in Book/Report/Conference proceeding › Other book part › Scientific

TY - CHAP

T1 - Preface

T2 - 2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010

AU - Alimohammad, A.

AU - Baruzzo, A.

AU - Du Bousquet, L.

AU - Dini, P.

AU - Muccini, H.

AU - Klaus, A.

AU - Perälä, Juho

AU - Pandini, D.

AU - Senguttuvan, R.

AU - Sinha, A.

AU - Stefanescu, A.

AU - Vermeulen, B.

AU - Van Baelen, S.

AU - Gross, H.-G.

N1 - Conference code: 2

PY - 2010

Y1 - 2010

N2 - Presents the introductory welcome message from the conference proceedings. May include the conference officers' congratulations to all involved with the conference event and publication of the proceedings record.

AB - Presents the introductory welcome message from the conference proceedings. May include the conference officers' congratulations to all involved with the conference event and publication of the proceedings record.

U2 - 10.1109/VALID.2010.4

DO - 10.1109/VALID.2010.4

M3 - Other book part

SN - 978-0-7695-4146-4

SN - 978-1-4244-7784-5

SP - viii-ix

BT - Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010

PB - IEEE Institute of Electrical and Electronic Engineers

Y2 - 22 August 2010 through 27 August 2010

ER -

Alimohammad A, Baruzzo A, Du Bousquet L, Dini P, Muccini H, Klaus A et al. Preface: Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010. In Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010. IEEE Institute of Electrical and Electronic Engineers. 2010. p. viii-ix doi: 10.1109/VALID.2010.4

Preface: Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010

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