Proton irradiation-induced blistering in UO2

Janne Pakarinen (Corresponding Author), Lingfeng He, Jian Gan, Andrew T. Nelson, Anter El-Azab, Marat Khafizov, Todd R. Allen

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    Abstract

    Proton (H+) irradiation effects in polycrystalline UO2 have been studied. The irradiation was carried out using three ion energies and two different ion fluxes at 600 °C. Scanning electron microscopy (SEM) investigations showed that significant surface flaking took place. Focused ion beam (FIB) milling in SEM was successfully applied for extracting lamellas from uneven blistered surfaces for transmission electron microscopy (TEM) investigations allowing detailed investigations for the degradation mechanisms. High-resolution TEM for the flaked UO2 surfaces revealed that the implanted H+ formed sharp two-dimensional cavities at the peak ion-stopping region instead of diffusing to the matrix. The resulting lateral stress likely caused UO2 surface deterioration in good agreement with previous blistering and flaking studies on crystalline materials. Graphical abstract: [Figure not available: see fulltext.]

    Original languageEnglish
    Pages (from-to)1032-1036
    Number of pages5
    JournalMRS Advances
    Volume6
    Issue number47-48
    DOIs
    Publication statusPublished - Dec 2021
    MoE publication typeA1 Journal article-refereed

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