Ion backscattering spectra for 1H, 4He, 7Li, 12C, 16O and 28Si ions incident on thin and thick superconductor samples in the energy range 2-28 MeV have been measured. The spectra are analyzed by using a computer program package for ion backscattering data analysis. The general characteristics of the ion beams for the backscattering analysis of high-Tc superconductors both in the Rutherford and non-Rutherford energy regime are discussed. The advantages and disadvantages of using proton and heavy ion beams are compared to those of conventional 4He ion backscattering.
|Number of pages||8|
|Journal||Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms|
|Publication status||Published - 2 Jul 1991|
|MoE publication type||A1 Journal article-refereed|