Pulsed-laser deposited amorphous-like PZT thin-films: Microstructure and optical properties

J. Lappalainen (Corresponding Author), J. Puustinen, Jussi Hiltunen, V. Lantto

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

Abstract

Amorphous lead–zirconate–titanate (Pb0.97Nd0.02(Zr0.55Ti0.45)O3, PNZT) thin-films were grown on single-crystal MgO(1 0 0) substrates at room temperature by pulsed laser deposition (PLD). Part of PNZT films was left as-deposited amorphous and others were post-annealed at temperatures from 100 to 400 °C. X-ray diffraction (XRD) and scanning probe microscopy (SPM) were used to characterize the microstructure. Optical properties were analyzed using spectrophotometry at UV–vis–NIR and prism-coupler method at 633 nm wavelengths. Initially, films were amorphous with a broad XRD peak around 2θ ≈ 29.7°. As the post-annealing temperature increased above 250 °C, the amorphous peak started to shift towards lower 2θ-angles and got narrower indicating of decreasing interatomic spacing and possible glass transformation. At the same time, the transmittance at all wavelengths increased remarkably, although no crystal structure was detected by XRD. Also, sharp optical TE0 modes with full-width half-maximum (FWHM) values of Δβ ≈ 0.00067 could be coupled into these films.
Original languageEnglish
Pages (from-to)497-502
Number of pages6
JournalJournal of the European Ceramic Society
Volume30
Issue number2
DOIs
Publication statusPublished - 2010
MoE publication typeA1 Journal article-refereed

Fingerprint

Pulsed lasers
Optical properties
X ray diffraction
Thin films
Microstructure
Scanning probe microscopy
Wavelength
Spectrophotometry
Amorphous films
Pulsed laser deposition
Prisms
Temperature
Crystal structure
Single crystals
Annealing
Glass
Substrates

Keywords

  • amorphous
  • films
  • PNZT thin films
  • thin films
  • optical properties
  • PZT

Cite this

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title = "Pulsed-laser deposited amorphous-like PZT thin-films: Microstructure and optical properties",
abstract = "Amorphous lead–zirconate–titanate (Pb0.97Nd0.02(Zr0.55Ti0.45)O3, PNZT) thin-films were grown on single-crystal MgO(1 0 0) substrates at room temperature by pulsed laser deposition (PLD). Part of PNZT films was left as-deposited amorphous and others were post-annealed at temperatures from 100 to 400 °C. X-ray diffraction (XRD) and scanning probe microscopy (SPM) were used to characterize the microstructure. Optical properties were analyzed using spectrophotometry at UV–vis–NIR and prism-coupler method at 633 nm wavelengths. Initially, films were amorphous with a broad XRD peak around 2θ ≈ 29.7°. As the post-annealing temperature increased above 250 °C, the amorphous peak started to shift towards lower 2θ-angles and got narrower indicating of decreasing interatomic spacing and possible glass transformation. At the same time, the transmittance at all wavelengths increased remarkably, although no crystal structure was detected by XRD. Also, sharp optical TE0 modes with full-width half-maximum (FWHM) values of Δβ ≈ 0.00067 could be coupled into these films.",
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author = "J. Lappalainen and J. Puustinen and Jussi Hiltunen and V. Lantto",
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Pulsed-laser deposited amorphous-like PZT thin-films : Microstructure and optical properties. / Lappalainen, J. (Corresponding Author); Puustinen, J.; Hiltunen, Jussi; Lantto, V.

In: Journal of the European Ceramic Society, Vol. 30, No. 2, 2010, p. 497-502.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Pulsed-laser deposited amorphous-like PZT thin-films

T2 - Microstructure and optical properties

AU - Lappalainen, J.

AU - Puustinen, J.

AU - Hiltunen, Jussi

AU - Lantto, V.

PY - 2010

Y1 - 2010

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AB - Amorphous lead–zirconate–titanate (Pb0.97Nd0.02(Zr0.55Ti0.45)O3, PNZT) thin-films were grown on single-crystal MgO(1 0 0) substrates at room temperature by pulsed laser deposition (PLD). Part of PNZT films was left as-deposited amorphous and others were post-annealed at temperatures from 100 to 400 °C. X-ray diffraction (XRD) and scanning probe microscopy (SPM) were used to characterize the microstructure. Optical properties were analyzed using spectrophotometry at UV–vis–NIR and prism-coupler method at 633 nm wavelengths. Initially, films were amorphous with a broad XRD peak around 2θ ≈ 29.7°. As the post-annealing temperature increased above 250 °C, the amorphous peak started to shift towards lower 2θ-angles and got narrower indicating of decreasing interatomic spacing and possible glass transformation. At the same time, the transmittance at all wavelengths increased remarkably, although no crystal structure was detected by XRD. Also, sharp optical TE0 modes with full-width half-maximum (FWHM) values of Δβ ≈ 0.00067 could be coupled into these films.

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