Pulsed-laser deposited amorphous-like PZT thin-films: Microstructure and optical properties

J. Lappalainen (Corresponding Author), J. Puustinen, Jussi Hiltunen, V. Lantto

    Research output: Contribution to journalArticleScientificpeer-review

    3 Citations (Scopus)

    Abstract

    Amorphous lead–zirconate–titanate (Pb0.97Nd0.02(Zr0.55Ti0.45)O3, PNZT) thin-films were grown on single-crystal MgO(1 0 0) substrates at room temperature by pulsed laser deposition (PLD). Part of PNZT films was left as-deposited amorphous and others were post-annealed at temperatures from 100 to 400 °C. X-ray diffraction (XRD) and scanning probe microscopy (SPM) were used to characterize the microstructure. Optical properties were analyzed using spectrophotometry at UV–vis–NIR and prism-coupler method at 633 nm wavelengths. Initially, films were amorphous with a broad XRD peak around 2θ ≈ 29.7°. As the post-annealing temperature increased above 250 °C, the amorphous peak started to shift towards lower 2θ-angles and got narrower indicating of decreasing interatomic spacing and possible glass transformation. At the same time, the transmittance at all wavelengths increased remarkably, although no crystal structure was detected by XRD. Also, sharp optical TE0 modes with full-width half-maximum (FWHM) values of Δβ ≈ 0.00067 could be coupled into these films.
    Original languageEnglish
    Pages (from-to)497-502
    Number of pages6
    JournalJournal of the European Ceramic Society
    Volume30
    Issue number2
    DOIs
    Publication statusPublished - 2010
    MoE publication typeA1 Journal article-refereed

    Keywords

    • amorphous
    • films
    • PNZT thin films
    • thin films
    • optical properties
    • PZT

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