Abstract
| Original language | English |
|---|---|
| Pages (from-to) | 497-502 |
| Number of pages | 6 |
| Journal | Journal of the European Ceramic Society |
| Volume | 30 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 2010 |
| MoE publication type | A1 Journal article-refereed |
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Keywords
- amorphous
- films
- PNZT thin films
- thin films
- optical properties
- PZT
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Pulsed-laser deposited amorphous-like PZT thin-films : Microstructure and optical properties. / Lappalainen, J. (Corresponding Author); Puustinen, J.; Hiltunen, Jussi; Lantto, V.
In: Journal of the European Ceramic Society, Vol. 30, No. 2, 2010, p. 497-502.Research output: Contribution to journal › Article › Scientific › peer-review
TY - JOUR
T1 - Pulsed-laser deposited amorphous-like PZT thin-films
T2 - Microstructure and optical properties
AU - Lappalainen, J.
AU - Puustinen, J.
AU - Hiltunen, Jussi
AU - Lantto, V.
PY - 2010
Y1 - 2010
N2 - Amorphous lead–zirconate–titanate (Pb0.97Nd0.02(Zr0.55Ti0.45)O3, PNZT) thin-films were grown on single-crystal MgO(1 0 0) substrates at room temperature by pulsed laser deposition (PLD). Part of PNZT films was left as-deposited amorphous and others were post-annealed at temperatures from 100 to 400 °C. X-ray diffraction (XRD) and scanning probe microscopy (SPM) were used to characterize the microstructure. Optical properties were analyzed using spectrophotometry at UV–vis–NIR and prism-coupler method at 633 nm wavelengths. Initially, films were amorphous with a broad XRD peak around 2θ ≈ 29.7°. As the post-annealing temperature increased above 250 °C, the amorphous peak started to shift towards lower 2θ-angles and got narrower indicating of decreasing interatomic spacing and possible glass transformation. At the same time, the transmittance at all wavelengths increased remarkably, although no crystal structure was detected by XRD. Also, sharp optical TE0 modes with full-width half-maximum (FWHM) values of Δβ ≈ 0.00067 could be coupled into these films.
AB - Amorphous lead–zirconate–titanate (Pb0.97Nd0.02(Zr0.55Ti0.45)O3, PNZT) thin-films were grown on single-crystal MgO(1 0 0) substrates at room temperature by pulsed laser deposition (PLD). Part of PNZT films was left as-deposited amorphous and others were post-annealed at temperatures from 100 to 400 °C. X-ray diffraction (XRD) and scanning probe microscopy (SPM) were used to characterize the microstructure. Optical properties were analyzed using spectrophotometry at UV–vis–NIR and prism-coupler method at 633 nm wavelengths. Initially, films were amorphous with a broad XRD peak around 2θ ≈ 29.7°. As the post-annealing temperature increased above 250 °C, the amorphous peak started to shift towards lower 2θ-angles and got narrower indicating of decreasing interatomic spacing and possible glass transformation. At the same time, the transmittance at all wavelengths increased remarkably, although no crystal structure was detected by XRD. Also, sharp optical TE0 modes with full-width half-maximum (FWHM) values of Δβ ≈ 0.00067 could be coupled into these films.
KW - amorphous
KW - films
KW - PNZT thin films
KW - thin films
KW - optical properties
KW - PZT
U2 - 10.1016/j.jeurceramsoc.2009.06.029
DO - 10.1016/j.jeurceramsoc.2009.06.029
M3 - Article
VL - 30
SP - 497
EP - 502
JO - Journal of the European Ceramic Society
JF - Journal of the European Ceramic Society
SN - 0955-2219
IS - 2
ER -