Pumping properties of the hybrid single-electron transistor in dissipative environment

S.V. Lotkhov; Antti Kemppinen; S. Kafanov; J.P. Pekola; A.B. Zorin

doi:10.1063/1.3227839

Pumping properties of the hybrid single-electron transistor in dissipative environment

S.V. Lotkhov^*
, Antti Kemppinen
, S. Kafanov
, J.P. Pekola
, A.B. Zorin

^*Corresponding author for this work

VTT Technical Research Centre of Finland

Research output: Contribution to journal › Article › Scientific › peer-review

24 Citations (Scopus)

Abstract

Pumping characteristics were studied of a hybrid normal-metal/superconductor single-electron transistor embedded in high-Ohmic environment. Two 3 µm long microstrip resistors of CrO_xwith a sum resistance R≈80 kΩ were placed adjacent to the transistor. Substantial improvement of pumping and a reduction of the subgap leakage were observed in the low-megahertz range. At higher frequencies (0.1–1 GHz), pumping performance deteriorated compared to reference devices without resistors by the slowdown of tunneling and by electronic heating.

Original language	English
Number of pages	3
Journal	Applied Physics Letters
Volume	95
Issue number	11
DOIs	https://doi.org/10.1063/1.3227839
Publication status	Published - 2009
MoE publication type	A1 Journal article-refereed

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title = "Pumping properties of the hybrid single-electron transistor in dissipative environment",

abstract = "Pumping characteristics were studied of a hybrid normal-metal/superconductor single-electron transistor embedded in high-Ohmic environment. Two 3 µm long microstrip resistors of CrOx with a sum resistance R≈80 kΩ were placed adjacent to the transistor. Substantial improvement of pumping and a reduction of the subgap leakage were observed in the low-megahertz range. At higher frequencies (0.1–1 GHz), pumping performance deteriorated compared to reference devices without resistors by the slowdown of tunneling and by electronic heating.",

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AU - Lotkhov, S.V.

AU - Kemppinen, Antti

AU - Kafanov, S.

AU - Pekola, J.P.

AU - Zorin, A.B.

PY - 2009

Y1 - 2009

N2 - Pumping characteristics were studied of a hybrid normal-metal/superconductor single-electron transistor embedded in high-Ohmic environment. Two 3 µm long microstrip resistors of CrOx with a sum resistance R≈80 kΩ were placed adjacent to the transistor. Substantial improvement of pumping and a reduction of the subgap leakage were observed in the low-megahertz range. At higher frequencies (0.1–1 GHz), pumping performance deteriorated compared to reference devices without resistors by the slowdown of tunneling and by electronic heating.

AB - Pumping characteristics were studied of a hybrid normal-metal/superconductor single-electron transistor embedded in high-Ohmic environment. Two 3 µm long microstrip resistors of CrOx with a sum resistance R≈80 kΩ were placed adjacent to the transistor. Substantial improvement of pumping and a reduction of the subgap leakage were observed in the low-megahertz range. At higher frequencies (0.1–1 GHz), pumping performance deteriorated compared to reference devices without resistors by the slowdown of tunneling and by electronic heating.

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DO - 10.1063/1.3227839

M3 - Article

SN - 0003-6951

VL - 95

JO - Applied Physics Letters

JF - Applied Physics Letters

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ER -

Pumping properties of the hybrid single-electron transistor in dissipative environment

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